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Raymond R. Hayes

dblp:01/3731 · DBLP profile ↗
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3ranked-venue papers
0as first author
0since 2021 · last 1989
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Artificial intelligence and machine learning · 3

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Artificial intelligence
3 papers
Learning theory · 86% Probabilistic and Bayesian machine learning · 14%

Topics — the 7 heaviest of 8, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Machine learning › Learning theory › classification
classifier design
0.021989
Effects of Sample Size in Classifier Design · IEEE Trans. Pattern Anal. Mach. Intell. 1989
The Reduced Parzen Classifier · IEEE Trans. Pattern Anal. Mach. Intell. 1989
Machine learning › Learning theory › classification › classification error analysis
bayes error estimation
0.011989
The Reduced Parzen Classifier · IEEE Trans. Pattern Anal. Mach. Intell. 1989
Machine learning › Learning theory › classification
classifier evaluation
0.011989
Estimation of Classifier Performance · IEEE Trans. Pattern Anal. Mach. Intell. 1989
Machine learning › Learning theory › statistical estimation
error estimation
0.011989
Estimation of Classifier Performance · IEEE Trans. Pattern Anal. Mach. Intell. 1989
Machine learning › Probabilistic and Bayesian machine learning › statistical inference › density estimation
parzen density estimation
0.011989
The Reduced Parzen Classifier · IEEE Trans. Pattern Anal. Mach. Intell. 1989
Machine learning › Learning theory › statistical learning theory
bias-variance tradeoff
0.011989
Effects of Sample Size in Classifier Design · IEEE Trans. Pattern Anal. Mach. Intell. 1989
Machine learning › Learning theory › resampling
bootstrap methods
0.011989
Estimation of Classifier Performance · IEEE Trans. Pattern Anal. Mach. Intell. 1989

Methods — techniques the papers use, named apart from their topics

resubstitution · 0.0representative sample selection · 0.0quadratic classifier · 0.0piecewise quadratic classifier · 0.0linear classifier · 0.0leave-one-out · 0.0bootstrap · 0.0bhattacharyya distance · 0.0
YearPublicationVenuePosition
1989 The Reduced Parzen Classifier
abstract
The Parzen density estimate is known to be an effective tool for estimating the Bayes error, given a set of training samples from the class distributions. An algorithm is developed to select a given number of representative samples whose Parzen density estimate closely matches that of the entire sample set. Using this reduced representative set, a piecewise quadratic classifier which provides nearly optimal performance is designed.>
Keinosuke Fukunaga, Raymond R. Hayes
IEEE Trans. Pattern Anal. Mach. Intell.2
1989 Effects of Sample Size in Classifier Design
abstract
The effect of finite sample-size on parameter estimates and their subsequent use in a family of functions are discussed. General and parameter-specific expressions for the expected bias and variance of the functions are derived. These expressions are then applied to the Bhattacharyya distance and the analysis of the linear and quadratic classifiers, providing insight into the relationship between the number of features and the number of training samples. Because of the functional form of the expressions, an empirical approach is presented to enable asymptotic performance to be accurately estimated using a very small number of samples. Results were experimentally verified using artificial data in controlled cases and using real, high-dimensional data.>
Keinosuke Fukunaga, Raymond R. Hayes
IEEE Trans. Pattern Anal. Mach. Intell.2
1989 Estimation of Classifier Performance
abstract
An expression for expected classifier performance previously derived by the authors (ibid., vol.11, no.8, p.873-855, Aug. 1989) is applied to a variety of error estimation methods and a unified and comprehensive approach to the analysis of classifier performance is presented. After the error expression is introduced, it is applied to three cases: (1) a given classifier and a finite test set; (2) given test distributions a finite design set; and (3) finite and independent design and test sets. For all cases, the expected values and variances of the classifier errors are presented. Although the study of Case 1 does not produce any new results, it is important to confirm that the proposed approach produces the known results, and also to show how these results are modified when the design set becomes finite, as in Cases 2 and 3. The error expression is used to compute the bias between the leave-one-out and resubstitution errors for quadratic classifiers. The effect of outliers in design samples on the classification error is discussed. Finally, the theoretical analysis of the bootstrap method is presented for quadratic classifiers.>
Keinosuke Fukunaga, Raymond R. Hayes
IEEE Trans. Pattern Anal. Mach. Intell.2