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Man-Yuen Wong

dblp:03/551 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 1992
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Software engineering, systems software and programming languages · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Software engineering, system software, and programming languages
1 paper
Software maintenance and evolution · 77% Software testing · 23%

Topics — the 1 heaviest of 2, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Software maintenance and evolution › software quality assurance › defect analysis
defect classification
0.011992
Orthogonal Defect Classification - A Concept for In-Process Measurements · IEEE Trans. Software Eng. 1992

Methods — techniques the papers use, named apart from their topics

defect type distribution · 0.0defect trigger distribution · 0.0
YearPublicationVenuePosition
1992 Orthogonal Defect Classification - A Concept for In-Process Measurements
abstract
Orthogonal defect classification (ODC), a concept that enables in-process feedback to software developers by extracting signatures on the development process from defects, is described. The ideas are evolved from an earlier finding that demonstrates the use of semantic information from defects to extract cause-effect relationships in the development process. This finding is leveraged to develop a systematic framework for building measurement and analysis methods. The authors define ODC and discuss the necessary and sufficient conditions required to provide feedback to a developer; illustrate the use of the defect type distribution to measure the progress of a product through a process; illustrate the use of the defect trigger distribution to evaluate the effectiveness and eventually the completeness of verification processes such as inspection or testing; provides sample results from pilot projects using ODC; and open the doors to a wide variety of analysis techniques for providing effective and fast feedback based on the concepts of ODC.>
Ram Chillarege, Inderpal S. Bhandari, Jarir K. Chaar, Michael J. Halliday, Diane S. Moebus, Bonnie K. Ray, Man-Yuen Wong
IEEE Trans. Software Eng.7