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Robert G. Cantarella

dblp:04/3827 · DBLP profile ↗
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1ranked-venue papers
1as first author
0since 2021 · last 1983
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Hardware reliability and fault tolerance · 75% Storage systems · 25%

Topics — the 4 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Hardware reliability and fault tolerance › redundancy
parallel redundant systems		 0.011983
The Reliability of Periodically Repaired n - l/n Parallel Redundant Systems · IEEE Trans. Computers 1983
Hardware reliability and fault tolerance › reliability modeling
periodically repaired systems		 0.011983
The Reliability of Periodically Repaired n - l/n Parallel Redundant Systems · IEEE Trans. Computers 1983
Hardware reliability and fault tolerance
redundancy		 0.011983
The Reliability of Periodically Repaired n - l/n Parallel Redundant Systems · IEEE Trans. Computers 1983
Storage systems
repair		 0.011983
The Reliability of Periodically Repaired n - l/n Parallel Redundant Systems · IEEE Trans. Computers 1983

Methods — techniques the papers use, named apart from their topics

markov modeling · 0.0failure rate analysis · 0.0
YearPublicationVenuePosition
1983 The Reliability of Periodically Repaired n - l/n Parallel Redundant Systems
abstract
The average failure rate of an n − 1/n parallel redundant system of n identical elements, each of which has a constant failure rate of λ, that is repaired every T hours can be approximated by the upper bound n(n − 1)λ2T/2. If λT < 1, the ratio of the upper bound to the actual average failure rate is less than or equal to I + (n −)λT/I − λT/2. These formulas provide a convenient method for predicting the reliability of such systems with a quantitative error bound.
Robert G. Cantarella
 IEEE Trans. Computers1