Demo Data from VLDB 2026 / reviewers in the wild / expert
W. F. Mikhail
dblp:04/5305
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 1982
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Hardware reliability and fault tolerance · 67% Memory systems · 33% | |
| Theoretical computer science
1 paper |
Coding theory · 100% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Hardware reliability and fault tolerance
error correction |
0.0 | 1 | 1982 | The Reliability of Memory with Single-Error Correction · IEEE Trans. Computers 1982 |
Hardware reliability and fault tolerance
memory reliability |
0.0 | 1 | 1982 | The Reliability of Memory with Single-Error Correction · IEEE Trans. Computers 1982 |
Memory systems
semiconductor memory |
0.0 | 1 | 1982 | The Reliability of Memory with Single-Error Correction · IEEE Trans. Computers 1982 |
Coding theory
error-correcting codes |
0.0 | 1 | 1982 | The Reliability of Memory with Single-Error Correction · IEEE Trans. Computers 1982 |
Methods — techniques the papers use, named apart from their topics
reliability modeling · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1982 | The Reliability of Memory with Single-Error CorrectionabstractThis correspondence contains the derivation of the reliability, as a function of time, of semiconductor memory with single-error correction. The results are applicable to a wide range of memory organizations. W. F. Mikhail, R. W. Bartoldus, R. A. Rutledge |
IEEE Trans. Computers | 1 |