Demo Data from VLDB 2026 / reviewers in the wild / expert
Liang T. Wu
dblp:05/2889
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 1980
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Hardware reliability and fault tolerance · 61% Performance modeling and evaluation · 30% Embedded and real-time systems · 9% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Hardware reliability and fault tolerance › fault-tolerant architecture
fault-tolerant computer |
0.0 | 1 | 1980 | Performability Evaluation of the SIFT Computer · IEEE Trans. Computers 1980 |
Performance modeling and evaluation
performability analysis |
0.0 | 1 | 1980 | Performability Evaluation of the SIFT Computer · IEEE Trans. Computers 1980 |
Hardware reliability and fault tolerance
reliability analysis |
0.0 | 1 | 1980 | Performability Evaluation of the SIFT Computer · IEEE Trans. Computers 1980 |
Embedded and real-time systems
cyber-physical system platforms |
0.0 | 1 | 1980 | Performability Evaluation of the SIFT Computer · IEEE Trans. Computers 1980 |
Methods — techniques the papers use, named apart from their topics
stochastic process modeling · 0.0capability function · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1980 | Performability Evaluation of the SIFT ComputerabstractPerformability modeling and evaluation methods are applied to the SIFT computer in the computational environment of an air transport mission. User-visible performance of the "total system" (SIFT plus its environment) is modeled as a random variable taking values in a set of "accomplishment levels." These levels are defined in terms of four attributes of total system behavior: safety, no change in mission profile, no operational penalties, and no economic penalties. The "base model" of the total system is a stochastic process whose states describe the internal structure of SIFT as well as relevant conditions of its environment. Base model state trajectories are related to accomplishment levels via a "capability function" which is formulated in terms of a three-level model hierarchy. Solution methods are then applied to determine the performability of the total system for various choices of computer and environment parameter values. John F. Meyer, David G. Furchtgott, Liang T. Wu |
IEEE Trans. Computers | 3 |