Demo Data from VLDB 2026 / reviewers in the wild / expert
Anup B. Sharma
dblp:07/5207
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 1991
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 46% Hardware reliability and fault tolerance · 36% Distributed systems · 18% |
Topics — the 7 heaviest of 7, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Hardware reliability and fault tolerance
fault diagnosis and repair |
0.0 | 1 | 1991 | Increased Thoughput for the Testing and Repair of RAM's with Redundancy · IEEE Trans. Computers 1991 |
Distributed systems
fault tolerance |
0.0 | 1 | 1991 | Increased Thoughput for the Testing and Repair of RAM's with Redundancy · IEEE Trans. Computers 1991 |
Hardware reliability and fault tolerance
memory repair |
0.0 | 1 | 1991 | Increased Thoughput for the Testing and Repair of RAM's with Redundancy · IEEE Trans. Computers 1991 |
Electronic design automation › hardware verification and test
memory testing |
0.0 | 1 | 1991 | Increased Thoughput for the Testing and Repair of RAM's with Redundancy · IEEE Trans. Computers 1991 |
Electronic design automation › hardware test › integrated circuit testing
RAM testing |
0.0 | 1 | 1991 | Increased Thoughput for the Testing and Repair of RAM's with Redundancy · IEEE Trans. Computers 1991 |
Electronic design automation
hardware verification and test |
0.0 | 1 | 1991 | Increased Thoughput for the Testing and Repair of RAM's with Redundancy · IEEE Trans. Computers 1991 |
Electronic design automation › hardware verification and test
online testing |
0.0 | 1 | 1991 | Increased Thoughput for the Testing and Repair of RAM's with Redundancy · IEEE Trans. Computers 1991 |
Methods — techniques the papers use, named apart from their topics
spare row/column allocation · 0.0online algorithm · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1991 | Increased Thoughput for the Testing and Repair of RAM's with RedundancyabstractThe problem of determining whether a redundant random-access memory (RRAM) containing faulty memory cells can be repaired with spare rows and columns is discussed. The approach is to increase the number of working RRAMs manufactured per unit time, rather than per wafer, by presenting a computationally efficient algorithm for detecting unrepairability, a computationally efficient algorithm for optimal repair for special patterns of faulty memory cells and online algorithms that can find an optimal repair or else detect unrepairability during memory testing, aborting unnecessary testing. Experimental validation of the approach is given that is based on industrial device fabrication data.> Ramsey W. Haddad, Anton T. Dahbura, Anup B. Sharma |
IEEE Trans. Computers | 3 |