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Luke T. Young

dblp:09/6768 · DBLP profile ↗
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3ranked-venue papers
0as first author
0since 2021 · last 1997
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 2Software engineering, systems software and programming languages · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
2 papers
Performance modeling and evaluation · 52% Hardware reliability and fault tolerance · 41% Distributed systems · 7%

Topics — the 7 heaviest of 7, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Hardware reliability and fault tolerance
dependability analysis
0.011997
DEPEND: A Simulation-Based Environment for System Level Dependability Analysis · IEEE Trans. Computers 1997
Performance modeling and evaluation › simulation › simulation-based evaluation
fault injection simulation
0.011997
DEPEND: A Simulation-Based Environment for System Level Dependability Analysis · IEEE Trans. Computers 1997
Performance modeling and evaluation
simulation
0.011997
DEPEND: A Simulation-Based Environment for System Level Dependability Analysis · IEEE Trans. Computers 1997
Hardware reliability and fault tolerance
failure analysis
0.011990
Automatic Recognition of Intermittent Failures: An Experimental Study of Field Data · IEEE Trans. Computers 1990
Distributed systems
fault tolerance
0.011997
DEPEND: A Simulation-Based Environment for System Level Dependability Analysis · IEEE Trans. Computers 1997
Hardware reliability and fault tolerance › redundancy › modular redundancy
triple modular redundancy
0.011997
DEPEND: A Simulation-Based Environment for System Level Dependability Analysis · IEEE Trans. Computers 1997
Performance modeling and evaluation
field data analysis
0.011990
Automatic Recognition of Intermittent Failures: An Experimental Study of Field Data · IEEE Trans. Computers 1990

Methods — techniques the papers use, named apart from their topics

simulation · 0.0fault injection · 0.0statistical analysis · 0.0
YearPublicationVenuePosition
1997 DEPEND: A Simulation-Based Environment for System Level Dependability Analysis
abstract
The paper presents the rationale for a functional simulation tool, called DEPEND, which provides an integrated design and fault injection environment for system level dependability analysis. The paper discusses the issues and problems of developing such a tool, and describes how DEPEND tackles them. Techniques developed to simulate realistic fault scenarios, reduce simulation time explosion, and handle the large fault model and component domain associated with system level analysis are presented. Examples are used to motivate and illustrate the benefits of this tool. To further illustrate its capabilities, DEPEND is used to simulate the Unix-based Tandem triple-modular-redundancy (TMR) based prototype fault-tolerant system and to evaluate how well it handles near-coincident errors caused by correlated and latent faults. Issues such as memory scrubbing, re-integration policies, and workload dependent repair times, which affect how the system handles near-coincident errors, are also evaluated. Unlike any other simulation-based dependability studies, the accuracy of the simulation model is validated by comparing the results of the simulations with measurements obtained from fault injection experiments conducted on a production Tandem machine.
Kumar K. Goswami, Ravishankar K. Iyer, Luke T. Young
IEEE Trans. Computers3
1995 Analysis of failures in the Tandem NonStop-UX Operating System
abstract
The paper presents results from an investigation of failures in several releases of Tandem's NonStop-UX Operating System, which is based on Unix System V. The analysis covers software failures from the field and failures reported by Tandem's test center. Fault classification is based on the status of the reported failures, the detection point of the errors in the operating system code, the panic message generated by the systems, the module that was found to be faulty, and the type of programming mistake. This classification reveals which modules in the operating system generate the most faults and the modules in which most errors are detected. We also present distributions of the failure and repair times including inter arrival time of unique failures and time between duplicate failures. These distributions, unlike generic time distributions, such as time between failures, help characterize the software quality. Distribution of the repair times emphasizes the repair process and the factors influencing repair. Distribution of up time of the systems before the panic reveals the factors triggering the panic.
Anshuman Thakur, Ravishankar K. Iyer, Luke T. Young, Inhwan Lee
ISSRE3
1990 Automatic Recognition of Intermittent Failures: An Experimental Study of Field Data
abstract
A methodology is proposed for recognizing the symptoms of persistent problems in large systems. The system error rate is used to identify the error states among which relationships may exist. Statistical techniques are used to validate and quantify the strength of the relationship among these error states. As input, the approach takes the raw error logs containing a single entry for each error that is detected as an isolated event. As output, it produces a list of symptoms that characterize persistent errors. Thus, given a failure, it is determined whether the failure is an intermittent manifestation of a common fault or whether it is an isolated (transient) incident. The technique is shown to work on two CYBER systems and on IBM 3081 multiprocessor system. Comparisons to real failure/repair information obtained from field engineers show that, in about 85% of the cases, the error symptoms recognized by this approach correspond to real problems. The remaining 15% of the cases, although not directly supported by field data, are confirmed as being valid problems.>
Ravishankar K. Iyer, Luke T. Young, P. V. Krishna Iyer
IEEE Trans. Computers2