VLDB 2026 Research / reviewers in the wild / expert
D. K. Chattopadhyay
dblp:10/1765
· DBLP profile ↗
3ranked-venue papers
0as first author
0since 2021 · last 1981
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 3
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
3 papers |
Hardware reliability and fault tolerance · 79% Integrated circuit design · 13% Electronic design automation · 8% | |
| Theoretical computer science
1 paper |
Coding theory · 100% |
Topics — the 7 heaviest of 7, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Hardware reliability and fault tolerance › fault-tolerant architecture
fault-tolerant sequential machine |
0.0 | 2 | 1981 | Realization of Fault-Tolerant Machines - Linear Code Application · IEEE Trans. Computers 1981 Realization of Fault-Tolerant and Fail-Safe Sequential Machines · IEEE Trans. Computers 1977 |
Hardware reliability and fault tolerance › permanent fault tolerance
stuck-at fault tolerance |
0.0 | 1 | 1977 | Realization of Fault-Tolerant and Fail-Safe Sequential Machines · IEEE Trans. Computers 1977 |
Integrated circuit design › digital circuit design
sequential circuit design |
0.0 | 1 | 1974 | Linearity Testing and Realization of Sequential Machines · IEEE Trans. Computers 1974 |
Coding theory › error-correcting codes › block codes
linear code |
0.0 | 1 | 1981 | Realization of Fault-Tolerant Machines - Linear Code Application · IEEE Trans. Computers 1981 |
Hardware reliability and fault tolerance › design for reliability
fail-safe design |
0.0 | 1 | 1977 | Realization of Fault-Tolerant and Fail-Safe Sequential Machines · IEEE Trans. Computers 1977 |
Electronic design automation › logic synthesis
sequential circuit synthesis |
0.0 | 1 | 1974 | Linearity Testing and Realization of Sequential Machines · IEEE Trans. Computers 1974 |
Electronic design automation › logic synthesis
state assignment |
0.0 | 1 | 1974 | Linearity Testing and Realization of Sequential Machines · IEEE Trans. Computers 1974 |
Methods — techniques the papers use, named apart from their topics
majority logic gates · 0.0linear codes · 0.0state transition matrix analysis · 0.0redundant state encoding · 0.0permanent and nonpermanent fault modeling · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1981 | Realization of Fault-Tolerant Machines - Linear Code ApplicationabstractThis correspondence deals with the fault-tolerant realization of a sequential machine using error-correcting (n,k) linear codes. Earlier works in the same area confine their attention to modified Reed-Muller Code and perfect Hamming Code and achieve the realization using a number of majority logic gates, which makes the entire realization quite complex. The realization discussed in this paper needs a smaller number of circuit components with less complexity. A. Sengupta, D. K. Chattopadhyay, A. Palit, A. K. Bandyopadhyay 0002, Arun K. Choudhury |
IEEE Trans. Computers | 2 |
| 1977 | Realization of Fault-Tolerant and Fail-Safe Sequential MachinesabstractGiven a synchronous sequential machine M, this correspondence deals with the fault-tolerant realization M of M and also its fail-safe realization M on the assumption that the faults that can occur to the circuitry of M or M are of permanent stuck-at type and the total number of faults can be at most some preset positive integer r. First, the realization of M or M is derived for r = 1 and then the same idea is extended to have the realization for any arbitrary r. It has been shown that the realization of M is such that it is also able to tolerate faults of nonpermanent nature. A. Sengupta, D. K. Chattopadhyay, A. Palit, A. K. Bandyopadhyay 0002, M. S. Basu, Arun K. Choudhury |
IEEE Trans. Computers | 2 |
| 1974 | Linearity Testing and Realization of Sequential MachinesabstractThe necessary and sufficient conditions for the linear realizability of a sequential machine are stated. The discussion considers the state transition and output functions separately and thus machines with nonlinear output function can also be tested for linearity of the state transition function. It then goes on to determine the characterizing matrices and corresponding secondary state assignment when such realization exists. The method can be applied to both permutation and nonpermutation machines. A. S. Gupta, D. K. Chattopadhyay, Arun K. Choudhury |
IEEE Trans. Computers | 2 |