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D. K. Chattopadhyay

dblp:10/1765 · DBLP profile ↗
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3ranked-venue papers
0as first author
0since 2021 · last 1981
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 3

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
3 papers
Hardware reliability and fault tolerance · 79% Integrated circuit design · 13% Electronic design automation · 8%
Theoretical computer science
1 paper
Coding theory · 100%

Topics — the 7 heaviest of 7, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Hardware reliability and fault tolerance › fault-tolerant architecture
fault-tolerant sequential machine
0.021981
Realization of Fault-Tolerant Machines - Linear Code Application · IEEE Trans. Computers 1981
Realization of Fault-Tolerant and Fail-Safe Sequential Machines · IEEE Trans. Computers 1977
Hardware reliability and fault tolerance › permanent fault tolerance
stuck-at fault tolerance
0.011977
Realization of Fault-Tolerant and Fail-Safe Sequential Machines · IEEE Trans. Computers 1977
Integrated circuit design › digital circuit design
sequential circuit design
0.011974
Linearity Testing and Realization of Sequential Machines · IEEE Trans. Computers 1974
Coding theory › error-correcting codes › block codes
linear code
0.011981
Realization of Fault-Tolerant Machines - Linear Code Application · IEEE Trans. Computers 1981
Hardware reliability and fault tolerance › design for reliability
fail-safe design
0.011977
Realization of Fault-Tolerant and Fail-Safe Sequential Machines · IEEE Trans. Computers 1977
Electronic design automation › logic synthesis
sequential circuit synthesis
0.011974
Linearity Testing and Realization of Sequential Machines · IEEE Trans. Computers 1974
Electronic design automation › logic synthesis
state assignment
0.011974
Linearity Testing and Realization of Sequential Machines · IEEE Trans. Computers 1974

Methods — techniques the papers use, named apart from their topics

majority logic gates · 0.0linear codes · 0.0state transition matrix analysis · 0.0redundant state encoding · 0.0permanent and nonpermanent fault modeling · 0.0
YearPublicationVenuePosition
1981 Realization of Fault-Tolerant Machines - Linear Code Application
abstract
This correspondence deals with the fault-tolerant realization of a sequential machine using error-correcting (n,k) linear codes. Earlier works in the same area confine their attention to modified Reed-Muller Code and perfect Hamming Code and achieve the realization using a number of majority logic gates, which makes the entire realization quite complex. The realization discussed in this paper needs a smaller number of circuit components with less complexity.
A. Sengupta, D. K. Chattopadhyay, A. Palit, A. K. Bandyopadhyay 0002, Arun K. Choudhury
IEEE Trans. Computers2
1977 Realization of Fault-Tolerant and Fail-Safe Sequential Machines
abstract
Given a synchronous sequential machine M, this correspondence deals with the fault-tolerant realization M of M and also its fail-safe realization M on the assumption that the faults that can occur to the circuitry of M or M are of permanent stuck-at type and the total number of faults can be at most some preset positive integer r. First, the realization of M or M is derived for r = 1 and then the same idea is extended to have the realization for any arbitrary r. It has been shown that the realization of M is such that it is also able to tolerate faults of nonpermanent nature.
A. Sengupta, D. K. Chattopadhyay, A. Palit, A. K. Bandyopadhyay 0002, M. S. Basu, Arun K. Choudhury
IEEE Trans. Computers2
1974 Linearity Testing and Realization of Sequential Machines
abstract
The necessary and sufficient conditions for the linear realizability of a sequential machine are stated. The discussion considers the state transition and output functions separately and thus machines with nonlinear output function can also be tested for linearity of the state transition function. It then goes on to determine the characterizing matrices and corresponding secondary state assignment when such realization exists. The method can be applied to both permutation and nonpermutation machines.
A. S. Gupta, D. K. Chattopadhyay, Arun K. Choudhury
IEEE Trans. Computers2