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Shi-ze Huang

dblp:11/1487 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 1995
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 100%

Topics — the 4 heaviest of 5, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation › hardware verification and test
fault diagnosis
0.011995
Sequentially t-Diagnosable Systems: A Characterization and Its Applications · IEEE Trans. Computers 1995
Electronic design automation › hardware verification and test › fault diagnosis › fault model-based diagnosis
PMC model
0.011995
Sequentially t-Diagnosable Systems: A Characterization and Its Applications · IEEE Trans. Computers 1995
Electronic design automation › hardware verification and test › fault diagnosis › diagnosability
sequential t-diagnosability
0.011995
Sequentially t-Diagnosable Systems: A Characterization and Its Applications · IEEE Trans. Computers 1995
Electronic design automation › hardware verification and test › fault diagnosis
system-level diagnosis
0.011995
Sequentially t-Diagnosable Systems: A Characterization and Its Applications · IEEE Trans. Computers 1995

Methods — techniques the papers use, named apart from their topics

graph characterization · 0.0
YearPublicationVenuePosition
1995 Sequentially t-Diagnosable Systems: A Characterization and Its Applications
abstract
In the system level fault diagnosis area, the fundamental problem of characterizing sequentially t-diagnosable systems in the PMC model has remained open for more than two decades. We resolve this problem by providing a complete characterization of such systems. Our solution to the characterization problem leads to the correct identification of optimal sequentially t-diagnosable D/sub /spl delta/,k/ systems. Given a set of n units where n=2t+1, an optimal D/sub /spl delta/,k/ system can be constructed with just n([(t+2)/3]) tests, rather than n([t/2]+1) tests-a previously misjudged bound. An efficient algorithm for identifying the set of faulty units in a sequentially t-diagnosable D/sub /spl delta/,k/ system is given along the line of the proposed characterization, which is linear with respect to the number of tests in the system.>
Jie Xu 0007, Shi-ze Huang
IEEE Trans. Computers2