Demonstration venue · read-only. Every page can be browsed; the buttons that would change it are switched off. Create an account to run TaxoReview on your own data. A simulation from public publication records: the people listed were not invited and did not agree to review.
? Tutorial for this page

Umberto Ravaioli

dblp:11/2769 · DBLP profile ↗
← Back
3ranked-venue papers
1as first author
0since 2021 · last 2003
—ORCID · unresolved

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 2 · 1 first-authorApplied, interdisciplinary, general and emerging computing · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
2 papers
Integrated circuit design · 100%
Interdisciplinary, comprehensive, and emerging computing
2 papers
Computing education · 91% Computational science and engineering · 9%

Topics — the 6 heaviest of 7, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Integrated circuit design
analog and mixed-signal circuits
0.012003
Differential negative resistance effect of output characteristics in deep sub-micrometer wurtzite AlGaN/GaN MODFETs · Sci. China Ser. F Inf. Sci. 2003
Computing education
educational technology
0.011994
Distributed exploratorium for high performance computational techniques · SC 1994
Computing education › computer science curriculum
high-performance computing education
0.011994
Distributed exploratorium for high performance computational techniques · SC 1994
Computing education › educational technology
interactive learning environment
0.011994
Distributed exploratorium for high performance computational techniques · SC 1994
Computational science and engineering
numerical analysis
0.011985
Advantages of Collocation Methods Over Finite Differences in One-Dimensional Monte Carlo Simulations of Submicron Devices · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1985
Integrated circuit design
semiconductor device modeling
0.011985
Advantages of Collocation Methods Over Finite Differences in One-Dimensional Monte Carlo Simulations of Submicron Devices · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1985

Methods — techniques the papers use, named apart from their topics

hyperlinked tutorials · 0.0computational modules · 0.0monte carlo simulation · 0.0finite difference · 0.0collocation methods · 0.0collocation method · 0.0
YearPublicationVenuePosition
2003 Differential negative resistance effect of output characteristics in deep sub-micrometer wurtzite AlGaN/GaN MODFETs
Baozeng Guo, Umberto Ravaioli
Sci. China Ser. F Inf. Sci.2
1994 Distributed exploratorium for high performance computational techniques
abstract
The exploratorium described here consists of hyper-linked tutorials and quizzes on high performance computational concepts and computational modules implemented on different computer systems: desktop workstations, vector and parallel supercomputers. The exploratorium provides a highly interactive environment in which students can experiment with computational modules and visually compare algorithms, numerical techniques, performance and implementation related issues. Such a hands-on simulation and experimentation based learning will enable students to gain a deeper understanding of advanced concepts. The World Wide Web based exploratorium fosters the easy development of instructional material from research software.>
Sridhar V. Iyer, Alan Beck, Umberto Ravaioli, Jeffrey A. Terstriep
SC3
1985 Advantages of Collocation Methods Over Finite Differences in One-Dimensional Monte Carlo Simulations of Submicron Devices
abstract
Collocation methods are very useful when one-dimensional Monte Carlo simulations of semiconductor submicron devices require a very accurate solution of Poisson's equation. Potential and electric field may be solved simultaneously with better accuracy than using finite differences. The extension to two dimensions is also outlined. We present the results obtained for Monte Carlo simulation of submicron W/Si and AuGaAs Schottky barrier diodes under forward bias conditions. The accurate solution for the electric field at the ohmic contact boundary allows us to model the injected current and to account for depletion of carriers. Tunnelling effects across the barrier are also included in the simulation.
Umberto Ravaioli, Paolo Lugli, Mohamed A. Osman, David K. Ferry
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.1