Virtual Prototypes (VPs) based on Transaction Level Modeling (TLM) have become a de-facto standard in today's SoC design, enabling early SW development. However, due to the growing complexity of SoC architectures full system simulations (HW+SW) become a bottleneck reducing this benefit. Hence, it is necessary to develop modeling styles which allow for further abstraction beyond the currently applied TLM methodology. This paper introduces such a modeling style, referred to as TLM+. It enables a higher modeling abstraction through merging hardware dependent driver software at the lowest level with the HW interface. Thus, sequences of HW transactions can be merged to single HW/SW transactions while preserving both the HW architecture and the low-level to high-level SW interfaces. In order to maintain the ability to validate timing-critical paths, a new resource model concept is introduced which compensates the loss of timing information, induced by merging HW transactions. Experimental results show a speed-up of up to 1000x at a timing error of approximately 10%.

In this paper a method for nominal design of analog integrated circuits is presented that includes process variations and operating ranges by worst-case parameter sets. These sets are calculated adaptively during the sizing process based on sensitivity analyses. The method leads to robust designs with high parametric yield, while being much more efficient than design centering methods.

We present a new method for mismatch analysis and automatic yield optimization of analog integrated circuits with respect to global, local and operational tolerances. Effectiveness and efficiency of yield estimation and optimization are guaranteed by consideration of feasibility regions and by performance linearization at worst-case points. The proposed methods were successfully applied to two example circuits for an industrial fabrication process. 1.

In this paper a new method for analog circuit sizing with respect to manufacturing and operating tolerances is presented. Two types of robustness objectives are presented, i.e. parameter distances for the nominal design and worst case distances for the design centering. Moreover, the generalized boundary curve is presented as a method to determine a parameter correction within an iterative trust region algorithm. Results show that a significant reduction in computational costs is achieved using the presented robustness objectives and generalized boundary curve.

In this paper a method for the automatic sizing of analog integrated circuits is presented. Basic sizing rules, representing circuit knowledge, are set up before the sizing and are introduced as structural constraints into the sizing process. Systematic consideration of these structural constraints during the automatic sizing prevents pathologically sized circuits and speeds up the automatic sizing. The sizing is done with a sensitivity-based, iterative trust region method.