Quantum process tomography is a critical task for characterizing the dynamics of quantum systems and achieving precise quantum control. In this paper, we propose a two-stage solution for both trace-preserving and non-trace-preserving quantum process tomography. Utilizing a tensor structure, our algorithm exhibits a computational complexity of$O(MLd^{2})$where d is the dimension of the quantum system and$M, L~(M\geq d^{2}, L\geq d^{2})$represent the numbers of different input states and measurement operators, respectively. We establish an analytical error upper bound and then design the optimal input states and the optimal measurement operators, which are both based on minimizing the error upper bound and maximizing the robustness characterized by the condition number. Numerical examples and testing on IBM quantum devices are presented to demonstrate the performance and efficiency of our algorithm.

Quantum detector tomography is a fundamental technique for calibrating quantum devices and performing quantum engineering tasks. In this paper, a novel quantum detector tomography method is proposed. First, a series of different probe states are used to generate measurement data. Then, using constrained linear regression estimation, a stage-1 estimation of the detector is obtained. Finally, the positive semidefinite requirement is added to guarantee a physical stage-2 estimation. This Two-stage Estimation (TSE) method has computational complexity O(nd2M), where n is the number of d-dimensional detector matrices and M is the number of different probe states. An error upper bound is established, and optimization on the coherent probe states is investigated. We perform simulation and a quantum optical experiment to testify the effectiveness of the TSE method.