Design, production and operation of modern system-on-chips rely on integrated instruments, which range from simple sensors to complex debug interfaces and design-for-test (DfT) structures. Reconfigurable scan networks (RSNs) as defined in IEEE Std. 1687-2014 provide an efficient access mechanism to such instruments. It is essential to test the access mechanism itself before it can be used for test, diagnosis, validation, calibration or runtime monitoring. Realistic fault mechanisms in RSNs are hard to test due to their high sequential depth and limited controllability and observability via serial scan ports.We present a novel low-cost DfT modification specifically designed for RSNs that enhances the observability of shadow registers. Furthermore, we present different test methods for stuck-at and more realistic gate-level fault models like flip-flop-internal and bridge faults. Experimental results demonstrate the effectiveness of the presented DfT modification and test methods.

The constantly growing amount of semiconductors in automotive systems increases the number of possible defect mechanisms, and therefore raises also the effort to maintain a sufficient level of quality and reliability. A promising solution to this problem is the on-line application of structural tests in key components, typically ECUs. In this work, an approach for the optimized integration of both Software-Based Self-Tests (SBST) and Built-In Self-Tests (BIST) into E/E architectures is presented. The approach integrates the execution of the tests non-intrusively, i. e., it (a) does not affect functional applications and (b) does not require costly changes in the communication schedules or additional communication overhead. Via design space exploration, optimized implementations with respect to multiple conflicting objectives, i. e., monetary costs, safety, test quality, and required execution time are derived.

With ever more complex automotive systems, the current approach of using functional tests to locate faulty components results in very long analysis procedures and poor diagnostic accuracy. Built-In Self-Test (BIST) offers a promising alternative to collect structural diagnostic information during E/E-architecture test. However, as the automotive industry is quite cost-driven, structural diagnosis shall not deteriorate traditional design objectives. With this goal in mind, the work at hand proposes a design space exploration to integrate structural diagnostic capabilities into an E/E-architecture design. The proposed integration is performed non-intrusively, i. e., the addition and execution of tests (a) does not affect any functional applications and (b) does not require any costly changes in the communication schedules.

The automotive industry has to deal with an increasing amount of electronics in today's vehicles. This paper describes the advantages of structural tests during in-field system test, reusing existing test data and on-chip structures. Demonstration is the embedded test of an ASIC within an automotive control unit, utilizing manufacturing scan-tests.