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Pengcheng Huang 0003

dblp:129/2239-3 · DBLP profile ↗
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4ranked-venue papers
3as first author
1since 2021 · last 2024
0000-0001-8239-467XORCID · verified

Domains — the database's venue-derived domains; a paper can count in several

Applied, interdisciplinary, general and emerging computing · 3 · 2 first-authorSystems, architecture and hardware · 1 · 1 first-author · 1 since 2021

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
3 papers
Hardware reliability and fault tolerance · 78% Integrated circuit design · 22%

Topics — the 4 heaviest of 5, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Hardware reliability and fault tolerance
soft errors
0.832017
Cost-effective SET-tolerant clock distribution network design by mitigating single event transient propagation · Sci. China Inf. Sci. 2017
Single event upset induced by single event double transient and its well-structure dependency in 65-nm bulk CMOS technology · Sci. China Inf. Sci. 2016
Simulation study of N-hit SET variation in differential cascade voltage switch logical circuits · Sci. China Inf. Sci. 2015
Hardware reliability and fault tolerance › soft errors
single event transient
0.522017
Cost-effective SET-tolerant clock distribution network design by mitigating single event transient propagation · Sci. China Inf. Sci. 2017
Simulation study of N-hit SET variation in differential cascade voltage switch logical circuits · Sci. China Inf. Sci. 2015
Integrated circuit design › clocking
clock distribution
0.312017
Cost-effective SET-tolerant clock distribution network design by mitigating single event transient propagation · Sci. China Inf. Sci. 2017
Hardware reliability and fault tolerance › soft errors
single-event upset
0.212016
Single event upset induced by single event double transient and its well-structure dependency in 65-nm bulk CMOS technology · Sci. China Inf. Sci. 2016

Methods — techniques the papers use, named apart from their topics

clock tree design · 0.3SET mitigation · 0.3simulation · 0.2
YearPublicationVenuePosition
2024 CAUTS: Clock Tree Optimization via Skewed Cells With Complementary Asymmetrical Uniform Transistor Sizing
abstract
In the physical design of integrated circuits, clock tree synthesis (CTS) plays a crucial role in terms of timing closure and overall design convergence. The existing clock tree (CT) optimization methods usually prefer to balance both clock edges, and the key insight of this article is that the clock work edge does not need to keep balance with another nonwork edge for the widely employed single-edge triggered circuits. This motivates us to achieve CT optimization by improving the performance of the work edge while sacrificing the performance of another edge. To this end, complementary asymmetrical uniform transistor sizing (CAUTS) methodology is proposed, which enables us to: 1) improve those conflicted metrics in systematic ways, including clock latency, power, and so on and 2) perform CTS optimization without any clock buffer insertion and clock routing adjustment and thus without area penalty. Experimental results based on the first-generation FinFET technology with six benchmark circuits and four industry intellectual properties (IPs) demonstrate that: 1) the clock latency is reduced by 5.9%–19.8% at each corner for all designs; 2) the clock power is reduced by 2.45%–15.12% at each corner for all designs; 3) setup timing is improved for all designs, and the total negative slack (TNS) of setup timing for unclean corners can be reduced by 10.9%–73.6%; and (4) hold timing is improved for all designs, and the TNS of hold timing can be reduced by 5.2%–19.8% for four industry IPs.
Pengcheng Huang 0003, Daheng Yue
IEEE Trans. Very Large Scale Integr. Syst.1
2017 Cost-effective SET-tolerant clock distribution network design by mitigating single event transient propagation
Peipei Hao, Shuming Chen, Pengcheng Huang 0003
Sci. China Inf. Sci.3
2016 Single event upset induced by single event double transient and its well-structure dependency in 65-nm bulk CMOS technology
Pengcheng Huang 0003, Shuming Chen
Sci. China Inf. Sci.1
2015 Simulation study of N-hit SET variation in differential cascade voltage switch logical circuits
Pengcheng Huang 0003, Shuming Chen, Zhengfa Liang, Chunmei Hu, Biwei Liu
Sci. China Inf. Sci.1