Demo Data from VLDB 2026 / reviewers in the wild / expert
Massimo Rudan
dblp:15/32
· DBLP profile ↗
10ranked-venue papers
0as first author
0since 2021 · last 2016
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 10
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
8 papers |
Integrated circuit design · 42% Electronic design automation · 37% Performance modeling and evaluation · 21% | |
| Interdisciplinary, comprehensive, and emerging computing
1 paper |
Computational science and engineering · 100% |
Topics — the 14 heaviest of 15, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › technology computer-aided design
device simulation |
0.0 | 5 | 1997 | An efficient solution scheme for the spherical-harmonics expansion of the Boltzmann transport equation [MOS transistors] · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1997 Numerical simulation of optical devices · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1993 Boundary fitted coordinated generation for device analysis on composite and complicated geometries · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1991 |
Performance modeling and evaluation
simulation |
0.0 | 2 | 2002 | Automatic 2-D and 3-D simulation of parasitic structures insmart-power integrated circuits · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2002 Sensitivity Analysis for Device Design · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1987 |
Integrated circuit design
analog and mixed-signal circuits |
0.0 | 1 | 2002 | Automatic 2-D and 3-D simulation of parasitic structures insmart-power integrated circuits · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2002 |
Electronic design automation › technology computer-aided design › device simulation
boltzmann transport equation |
0.0 | 1 | 1997 | An efficient solution scheme for the spherical-harmonics expansion of the Boltzmann transport equation [MOS transistors] · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1997 |
Integrated circuit design › analog and mixed-signal circuits
device modeling |
0.0 | 1 | 1996 | AC analysis of amorphous silicon devices · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1996 |
Integrated circuit design
semiconductor device modeling |
0.0 | 2 | 1991 | Hydrodynamic simulation of impact-ionization effects in p-n junctions · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1991 A new discretization strategy of the semiconductor equations comprising momentum and energy balance · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1988 |
Integrated circuit design › semiconductor devices
semiconductor device physics |
0.0 | 2 | 1991 | Hydrodynamic simulation of impact-ionization effects in p-n junctions · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1991 A new discretization strategy of the semiconductor equations comprising momentum and energy balance · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1988 |
Electronic design automation › technology computer-aided design
hydrodynamic simulation |
0.0 | 1 | 1991 | Hydrodynamic simulation of impact-ionization effects in p-n junctions · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1991 |
Electronic design automation › technology computer-aided design › device simulation
numerical device simulation |
0.0 | 1 | 1991 | Boundary fitted coordinated generation for device analysis on composite and complicated geometries · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1991 |
Computational science and engineering › numerical analysis
mesh refinement |
0.0 | 1 | 1989 | Adaptive mesh generation preserving the quality of the initial grid · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1989 |
Computational science and engineering
numerical simulation |
0.0 | 1 | 1989 | Adaptive mesh generation preserving the quality of the initial grid · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1989 |
Integrated circuit design › semiconductor device modeling
thin-film transistor modeling |
0.0 | 1 | 1996 | AC analysis of amorphous silicon devices · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1996 |
Performance modeling and evaluation › statistical analysis
sensitivity analysis |
0.0 | 1 | 1987 | Sensitivity Analysis for Device Design · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1987 |
Integrated circuit design › semiconductor devices
semiconductor device design |
0.0 | 1 | 1987 | Sensitivity Analysis for Device Design · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1987 |
Methods — techniques the papers use, named apart from their topics
device simulation · 0.0circuit-device mixed simulation · 0.0spherical harmonics expansion · 0.0numerical discretization · 0.0continuity equation solution · 0.0ac analysis · 0.0optical generation rate computation · 0.0black-body radiation modeling · 0.0finite difference method · 0.0boundary fitted coordinate transformation · 0.0monitor surface · 0.0local solution scheme · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2016 | An improved MPPT algorithm based on hybrid RCC scheme for single-phase PV systemsabstractSingle-stage H-bridge grid-connected inverters are considered as a simple, compact, and economic topology compared with double-stage converters. A maximum power point tracking (MPPT) control is necessary in photovoltaic (PV) generation system to extract maximum power from the PV arrays. Many MPPT techniques have been proposed and discussed in the literature. Among them, the ripple correlation control (RCC) algorithm is fast and effective, particularly suitable for single-phase configurations since it uses as perturbation the embedded oscillation of dc current and dc voltage at twice of grid frequency (e.g., 100 Hz). The main drawback of this method is the unstable behavior during sudden variation of sun irradiance, where the conventional RCC gives wrong estimation of the power derivative (dP/dV), causing wide dc voltage and dc current overshoots. To overcome this problem, a hybrid RCC-constant voltage regulator algorithm combined to a high-peformance dq grid current controller is proposed to improve the transient performance. The whole grid-connected photovoltaic generation scheme has been implemented numerically by MATLAB/Simulink, verifying steady-state and dynamic performances under different sun irradiance transients. The comparison with the corresponding behavior of a standard RCC algorithm emphasized the effectiveness of the proposed hybrid RCC controller. Manel Hammami, Gabriele Grandi, Massimo Rudan |
IECON | 3 |
| 2002 | Automatic 2-D and 3-D simulation of parasitic structures insmart-power integrated circuitsabstractA new method to efficiently describe parasitic bipolar structures in junction-isolated smart-power ICs is reported. Both two- and three-dimensional situations are tackled. An automatic simulation code for calculating the parasitic currents injected into the substrate by power devices, which may endanger the functioning of the signal-processing circuits, has been developed. Also, a Java graphical interface has been implemented with the aim of automatically managing the mixed circuit-device simulation. Examples of applications are given with reference to BCD5 technology. Elena Gnani, Vincenzo Giudicissi, Radu Vissarion, Claudio Contiero, Massimo Rudan |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 5 |
| 1997 | An efficient solution scheme for the spherical-harmonics expansion of the Boltzmann transport equation [MOS transistors]abstractThis paper investigates a number of numerical schemes applicable to the solution of the Boltzmann transport equation by means of a spherical-harmonics expansion (SHE). A new scheme is proposed that improves the solution at low energies, keeping the desired accuracy in the calculation of the mean quantities while saving a significant amount of CPU time. This is important in view of the applications of the method since the typical number of nodes to be used in the combined space-energy domain is in the range of 10/sup 4/-10/sup 5/. Maria Cristina Vecchi, Jan Mohring, Massimo Rudan |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 3 |
| 1996 | AC analysis of amorphous silicon devicesabstractThe transport model in semiconductors is examined in the case where the effect of distributed gap states is significant like, e.g., in thin-film transistors. A solution scheme is derived for the two additional continuity equations accounting for the trapped charge such that, without loss of generality, the efficiency of the traditional method implemented in the existing device-analysis codes is kept. The dynamic effect of the trapped charge is then examined in the ac operation of a realistic thin-film device, including the analysis of the interelectrode capacitances. Aurelio Pellegrini, Luigi Colalongo, Marina Valdinoci, Massimo Rudan |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 4 |
| 1993 | Numerical simulation of optical devicesabstractThe description of the optical-generation phenomena has been incorporated in the semiconductor-device analysis program HFIELDS, keeping the structural and geometrical flexibility of the original code. To this end a substantial effort has been devoted to the software implementation. The latter required the introduction of a number of optical windows and interleaved material layers through which a radiation with arbitrary spectrum, incidence angle, and polarization state enters the crystal. The corresponding generation rate at each node of the discretization grid is then evaluated by adding up the contribution of each monochromatic component of the impinging radiation. The code equipped with this new capability makes the description of realistic semiconductor optical sensors feasible. Black-body radiation has been incorporated into the code to allow for the simulation of solar cells. After a brief review of the underlying physics, the software implementation is described and a number of examples are illustrated.> Maria Cristina Vecchi, Massimo Rudan, Giovanni Soncini |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 2 |
| 1991 | Boundary fitted coordinated generation for device analysis on composite and complicated geometriesabstractA finite difference boundary fitted grid-generation method for composite and complicated geometries is described. In each region belonging to the domain of interest, a set of points is defined by differential transformation from a regular computational space, maintaining the continuity of coordinate lines crossing the internal boundaries. The definition of the relationship between the nodes yields a finite element mesh. Both the mathematical basis and the algorithmic implementation are shown, followed by an example of application to a realistic semiconductor device.> Zsolt Miklós Kovács-Vajna, Massimo Rudan |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 2 |
| 1991 | Hydrodynamic simulation of impact-ionization effects in p-n junctionsabstractUsing the hydrodynamic model of semiconductor devices, the authors simulate an abrupt p-n junction under strong reverse bias, accounting for impact ionization by means of electron and hole generation rates dependent on the carrier temperature. They demonstrate the influence of impact ionization as a cooling mechanism on the mean energy and velocity of the carriers, and show that the ionization coefficients alpha /sub n/ and alpha /sub p/ are spatially retarded with respect to the normally used electric-field dependent ones; this results in larger multiplication factors M/sub n/ and M/sub p/. The reason for this effect is traced back to the increased impact-ionization probability of secondary generated carriers having the chance to travel through a larger portion of the high-field region. This is shown qualitatively by discussing the impact ionization integrals, and is estimated quantitatively through the simulation.> Wolfgang Quade, Massimo Rudan, Eckehard Schöll |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 2 |
| 1989 | Adaptive mesh generation preserving the quality of the initial gridabstractAn algorithm allowing the automatic generation of a mesh and accounting for the main physical features of the problem is presented. The adaptivity is provided by a refinement strategy which preserves the characteristics of the initial grid, inserting nodes only in the regions where the solution deviates from a linear behavior. A geometrical interpretation in terms of a monitor surface is given, and various different approaches to the problem are discussed. The efficiency of the algorithm is enhanced by a local solution scheme, which uses previously computed values of all the unknown quantities as boundary conditions for the newly generated nodes. A few examples illustrate the performance of the algorithm.> Paolo Ciampolini, Alessandro Forghieri, Anna Pierantoni, Antonio Gnudi, Massimo Rudan, Giorgio Baccarani |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 5 |
| 1988 | A new discretization strategy of the semiconductor equations comprising momentum and energy balanceabstractA discretization scheme is applied to the hydrodynamic model for semiconductor devices that generalizes the Scharfetter-Gummel method to both the momentum-conservation and the energy-conservation equations. The major advantages of the scheme are: (1) the discretization is carried out without neglecting any terms, thus providing a satisfactory description of such effects as velocity overshoot and carrier heating; and (2) the resulting equations lend themselves to a self-consistent solution procedure similar to those currently used to solve the simpler drift-diffusion equations. Two-dimensional steady-state simulations of an n-channel MOSFET and of an n-p-n BJT (bipolar junction transistor) have been carried out by means of an improved version of the program HFIELDS. Carrier-temperature plots have been obtained with a reasonable computational effort, demonstrating the efficiency of this technique. The results have been compared with those obtained with the standard drift-diffusion model and significant differences in the electron concentration have been found, especially at the drain end of the MOSFET channel.> Alessandro Forghieri, Roberto Guerrieri, Paolo Ciampolini, Antonio Gnudi, Massimo Rudan, Giorgio Baccarani |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 5 |
| 1987 | Sensitivity Analysis for Device DesignabstractIn this paper we propose a sensitivity-analysis technique for device design. By this method, we determine the linearized variations of the device terminal characteristics following some change either in the impurity distribution, or in device geometry, such as channel length and oxide thickness. This technique has been implemented in our general-purpose two-dimensional device-analysis program (HFIELDS) and proved to be very efficient, as only the assembly of the RHS and one back-substituton is required in order to achieve the final result. It is believed that the present method can be profitably used for both deterministic and statistical device design. Antonio Gnudi, Paolo Ciampolini, Roberto Guerrieri, Massimo Rudan, Giorgio Baccarani |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 4 |