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Tom Bonifield

dblp:15/5215 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 2005
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 88% Integrated circuit design · 12%

Topics — the 4 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation › physical design › parasitic extraction
interconnect parasitic extraction		 0.112005
BEOL variability and impact on RC extraction · DAC 2005
Electronic design automation
physical design		 0.112005
BEOL variability and impact on RC extraction · DAC 2005
Integrated circuit design
digital circuit design		 0.012005
BEOL variability and impact on RC extraction · DAC 2005
Electronic design automation
signal integrity		 0.012005
BEOL variability and impact on RC extraction · DAC 2005

Methods — techniques the papers use, named apart from their topics

variability modeling · 0.1statistical modeling · 0.1
YearPublicationVenuePosition
2005 BEOL variability and impact on RC extraction
abstract
Historically, Back End of Line (BEOL) or interconnect resistance and capacitance have been viewed as parasitic components. They have now become key parameters with significant impact on circuit performance and signal integrity. This paper examines the types of BEOL variations and their impact on RC extraction. The importance of modeling systematic effects in RC extraction is discussed. The need for minimizing the computational error in RC extraction before incorporating random process variations is emphasized.
N. S. Nagaraj, Tom Bonifield, Abha Singh, Clive Bittlestone, Usha Narasimha, Viet Le, Anthony M. Hill
 DAC2