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Ting-Jun Fu

dblp:154/6172 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 2014
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 100%

Topics — the 4 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation › hardware verification and test › design for testability
built-in self-test		 0.212014
A BIST Scheme With the Ability of Diagnostic Data Compression for RAMs · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2014
Electronic design automation
hardware verification and test		 0.212014
A BIST Scheme With the Ability of Diagnostic Data Compression for RAMs · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2014
Electronic design automation › hardware verification and test › design for testability › built-in self-test
memory BIST		 0.212014
A BIST Scheme With the Ability of Diagnostic Data Compression for RAMs · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2014
Electronic design automation › hardware verification and test
test data compression		 0.212014
A BIST Scheme With the Ability of Diagnostic Data Compression for RAMs · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2014

Methods — techniques the papers use, named apart from their topics

march-element-based compression · 0.2march test · 0.2
YearPublicationVenuePosition
2014 A BIST Scheme With the Ability of Diagnostic Data Compression for RAMs
abstract
This paper proposes a built-in self-test (BIST) scheme with syndrome-compression ability for random access memories (RAMs) with static (SF) and dynamic faults (DFs). A March-element-based (MEB) compression scheme is proposed to reduce the volume of diagnostic data. The MEB compression scheme can efficiently compress the diagnostic data of a RAM tested by a March test for detecting SFs and DFs. Simulation results show that the compression ratio (the ratio of the number bits of the compressed diagnostic data to that of the original diagnostic data) is about 50.79% for an 8K×16-bit memory. The area overhead of the BIST with the MEB compressor is about 2.73% for an 8K×16-bit RAM using TSMC 0.18 um cell library.
Chih-Sheng Hou, Jin-Fu Li 0001, Ting-Jun Fu
 IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.3