Demo Data from VLDB 2026 / reviewers in the wild / expert
Jayachandran Sundararajan
dblp:16/5992
· DBLP profile ↗
2ranked-venue papers
0as first author
0since 2021 · last 2006
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 2
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Network and information security
2 papers |
Hardware security and side channels · 100% | |
| Computer architecture, parallel and distributed computing, and storage systems
2 papers |
Hardware reliability and fault tolerance · 100% |
Topics — the 6 heaviest of 6, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Hardware security and side channels
fault attacks |
0.1 | 2 | 2006 | Concurrent error detection for involutional functions with applications in fault-tolerant cryptographic hardware design · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2006 Tamper Proofing by Design Using Generalized Involution-Based Concurrent Error Detection for Involutional Substitution Permutation and Feistel Networks · IEEE Trans. Computers 2006 |
Hardware security and side channels › fault attack countermeasure
concurrent error detection |
0.1 | 1 | 2006 | Concurrent error detection for involutional functions with applications in fault-tolerant cryptographic hardware design · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2006 |
Hardware reliability and fault tolerance › error detection
concurrent error detection |
0.1 | 1 | 2006 | Tamper Proofing by Design Using Generalized Involution-Based Concurrent Error Detection for Involutional Substitution Permutation and Feistel Networks · IEEE Trans. Computers 2006 |
Hardware reliability and fault tolerance
soft errors |
0.1 | 1 | 2006 | Concurrent error detection for involutional functions with applications in fault-tolerant cryptographic hardware design · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2006 |
Hardware reliability and fault tolerance › error detection
transient fault detection |
0.1 | 1 | 2006 | Concurrent error detection for involutional functions with applications in fault-tolerant cryptographic hardware design · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2006 |
Hardware security and side channels
cryptographic hardware |
0.0 | 1 | 2006 | Concurrent error detection for involutional functions with applications in fault-tolerant cryptographic hardware design · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2006 |
Methods — techniques the papers use, named apart from their topics
time redundancy · 0.2involution property · 0.1fault simulation · 0.1
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2006 | Tamper Proofing by Design Using Generalized Involution-Based Concurrent Error Detection for Involutional Substitution Permutation and Feistel NetworksabstractSecure operation of cryptographic algorithms is critical to the success of secure transactions. Fault-based attacks that recover secret keys by deliberately introducing fault(s) in cipher implementations and analyzing the faulty outputs have been proven to be extremely powerful. Substitution Permutation Networks (SPN) and Feistel Networks (FN) are the two important classes of Symmetric Block Ciphers. Some SPN ciphers and all FN Ciphers satisfy the involution property. A function F is an involution if F(F(x)) = x. In this paper, we investigate tamper proofing techniques that use low cost involution-based time redundancy concurrent error detection (CED) schemes for involutional SPN and FN symmetric block ciphers. We incorporated this tamper proofing by design technique in a hardware implementation of the 128-bit ANUBIS SPN cipher (an involution variant of the Advanced Encryption Standard (AES)) and the 128-bit TwoFish FN cipher (an AES finalist). We performed fault simulation at both the algorithm and the gate level to show that the low-cost involution-based CED schemes, in addition to detecting all transient faults, can detect all single-bit permanent faults and > 99 percent of all multiple-bit permanent faults. Consequently, this low cost CED technique can protect the crypto device against Differential Fault Analysis (DFA) attacks. Nikhil Joshi, Jayachandran Sundararajan, Kaijie Wu 0001, Bo Yang 0010, Ramesh Karri |
IEEE Trans. Computers | 2 |
| 2006 | Concurrent error detection for involutional functions with applications in fault-tolerant cryptographic hardware designabstractIn this paper, a time redundancy based Concurrent Error Detection (CED) technique targeting involutional functions is presented. A function F is an involution if F(F(x))=x. The proposed CED technique exploits the involution property and checks if x=F(F(x)). Unlike traditional time redundancy based CED methods, this technique can detect both permanent and transient faults. Nikhil Joshi, Kaijie Wu 0001, Jayachandran Sundararajan, Ramesh Karri |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 3 |