VLDB 2026 Research / reviewers in the wild / expert
Vadim Okun
dblp:16/5995
· DBLP profile ↗
4ranked-venue papers
1as first author
0since 2021 · last 2008
0000-0003-2391-3681ORCID · corroborated
Domains — the database's venue-derived domains; a paper can count in several
Software engineering, systems software and programming languages · 4 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Software engineering, system software, and programming languages
1 paper |
Software testing · 100% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Software testing
mutation testing |
0.0 | 1 | 2000 | Mutation Operators for Specifications · ASE 2000 |
Software testing › test generation
specification-based test generation |
0.0 | 1 | 2000 | Mutation Operators for Specifications · ASE 2000 |
Software testing › test generation
test suite generation |
0.0 | 1 | 2000 | Mutation Operators for Specifications · ASE 2000 |
Software testing
fault detection |
0.0 | 1 | 2000 | Mutation Operators for Specifications · ASE 2000 |
Methods — techniques the papers use, named apart from their topics
mutation analysis · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2008 | IPOG/IPOG-D: efficient test generation for multi-way combinatorial testingabstractAbstract This paper presents two strategies for multi‐way testing (i.e.t‐way testing witht>2). The first strategy generalizes an existing strategy, called in‐parameter‐order, from pairwise testing to multi‐way testing. This strategy requires all multi‐way combinations to be explicitly enumerated. When the number of multi‐way combinations is large, however, explicit enumeration can be prohibitive in terms of both the space for storing these combinations and the time needed to enumerate them. To alleviate this problem, the second strategy combines the first strategy with a recursive construction procedure to reduce the number of multi‐way combinations that have to be enumerated. Both strategies are deterministic, i.e. they always produce the same test set for the same system configuration. This paper reports a multi‐way testing tool called FireEye, and provides an analytic and experimental evaluation of the two strategies. Copyright © 2007 John Wiley & Sons, Ltd. Yu Lei 0001, Raghu Kacker, D. Richard Kuhn, Vadim Okun, James Lawrence 0001 |
Softw. Test. Verification Reliab. | 4 |
| 2006 | Pseudo-Exhaustive Testing for SoftwareabstractPseudo-exhaustive testing uses the empirical observation that, for broad classes of software, a fault is likely triggered by only a few variables interacting. The method takes advantage of two relatively recent advances in software engineering: algorithms for efficiently generating covering arrays to represent software interaction test suites, and automated generation of test oracles using model checking. An experiment with a module of the traffic collision avoidance system (TCAS) illustrates the approach testing pairwise through 6-way interactions. We also outline current and future work applying the test methodology to a large real-world application, the personal identity verification (PIV) smart card D. Richard Kuhn, Vadim Okun |
SEW | 2 |
| 2004 | Comparison of fault classes in specification-based testing
Vadim Okun, Paul E. Black, Yaacov Yesha |
Inf. Softw. Technol. | 1 |
| 2000 | Mutation Operators for SpecificationsabstractTesting has a vital support role in the software engineering process, but developing tests often takes significant resources. A formal specification is a repository of knowledge about a system, and a recent method uses such specifications to automatically generate complete test suites via mutation analysis. We define an extensive set of mutation operators for use with this method. We report the results of our theoretical and experimental investigation of the relationships between the classes of faults detected by the various operators. Finally, we recommend sets of mutation operators which yield good test coverage at a reduced cost compared to using all proposed operators. Paul E. Black, Vadim Okun, Yaacov Yesha |
ASE | 2 |