Demo Data from VLDB 2026 / reviewers in the wild / expert
Matthew W. Heath
dblp:16/844
· DBLP profile ↗
2ranked-venue papers
2as first author
0since 2021 · last 2005
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 2 · 2 first-authorSoftware engineering, systems software and programming languages · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 61% Integrated circuit design · 39% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › hardware verification and test
design for testability |
0.1 | 1 | 2005 | Synchro-Tokens: A Deterministic GALS Methodology for Chip-Level Debug and Test · IEEE Trans. Computers 2005 |
Integrated circuit design › asynchronous circuit design
globally asynchronous locally synchronous design |
0.1 | 1 | 2005 | Synchro-Tokens: A Deterministic GALS Methodology for Chip-Level Debug and Test · IEEE Trans. Computers 2005 |
Electronic design automation
hardware verification and test |
0.1 | 1 | 2005 | Synchro-Tokens: A Deterministic GALS Methodology for Chip-Level Debug and Test · IEEE Trans. Computers 2005 |
Integrated circuit design
clocking |
0.0 | 1 | 2005 | Synchro-Tokens: A Deterministic GALS Methodology for Chip-Level Debug and Test · IEEE Trans. Computers 2005 |
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2005 | Synchro-Tokens: A Deterministic GALS Methodology for Chip-Level Debug and TestabstractThis paper describes a novel deterministic globally-asynchronous locally-synchronous (GALS) methodology called "synchro-tokens". Wrappers around the synchronous blocks keep the system globally asynchronous while ensuring that each transition, although arriving at a nondeterministic time, is sensed by the synchronous block during a deterministic cycle of the local clock. This determinism facilitates debug and test methodologies, such as the use of stored-pattern testers, which are effective only when the system behavior is predictable and repeatable. Applications of synchro-tokens to GALS systems with two or more synchronous blocks and one or more asynchronous data channels are shown. Synchro-tokens supports both pipelined and unpipelined channels and a variety of clock generation methodologies. Novel schematic level designs of the wrapper components in a 180-nm technology are used to compare the performance of several different deterministic GALS design styles. Matthew W. Heath, Wayne P. Burleson, Ian G. Harris |
IEEE Trans. Computers | 1 |
| 2004 | Synchro-Tokens: Eliminating Nondeterminism to Enable Chip-Level Test of Globally-Asynchronous Locally-Synchronous SoC?sabstractGlobally asynchronous locally synchronous (GALS) clocking applied to a system-on-a-chip (SoC) results in a design in which each core is a synchronous block (SB) of logic with a locally generated clock. Inter-core communication is asynchronous and controlled by wrapper logic around the cores. The nondeterministic synchronization used by most GALS architectures makes chip-level silicon debug and functional test difficult and costly. Deterministic GALS methodologies make dataflow assumptions which are only valid for a very limited set of applications. This paper describes a novel deterministic GALS methodology called "synchro-tokens" whose parameterized wrappers are flexible enough to be useful for a wide range of applications while supporting synchronous debug and test methodologies such as 1149.1 and P1500. The validation of determinism, estimation of area overhead, and analysis of performance impact are detailed. Matthew W. Heath, Wayne P. Burleson, Ian G. Harris |
DATE | 1 |