Demo Data from VLDB 2026 / reviewers in the wild / expert
Chaohui He
dblp:160/7413
· DBLP profile ↗
3ranked-venue papers
0as first author
0since 2021 · last 2018
0000-0002-7938-2907ORCID · corroborated
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 2Applied, interdisciplinary, general and emerging computing · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Hardware reliability and fault tolerance · 87% Integrated circuit design · 13% |
Topics — the 3 heaviest of 3, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Hardware reliability and fault tolerance › soft errors
single event transient |
0.3 | 1 | 2017 | Heavy ion micro-beam study of single-event transient (SET) in SiGe heterjunction bipolar transistor · Sci. China Inf. Sci. 2017 |
Hardware reliability and fault tolerance
soft errors |
0.3 | 1 | 2017 | Heavy ion micro-beam study of single-event transient (SET) in SiGe heterjunction bipolar transistor · Sci. China Inf. Sci. 2017 |
Integrated circuit design
analog and mixed-signal circuits |
0.1 | 1 | 2017 | Heavy ion micro-beam study of single-event transient (SET) in SiGe heterjunction bipolar transistor · Sci. China Inf. Sci. 2017 |
Methods — techniques the papers use, named apart from their topics
heavy ion micro-beam testing · 0.3
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2018 | A Fine-Grained Software-Implemented DMA Fault Tolerance for SoC Against Soft Error
Xiaozhi Du, Dongyang Luo, Chaohui He, Shuhuan Liu |
J. Electron. Test. | 3 |
| 2018 | FFI4SoC: a Fine-Grained Fault Injection Framework for Assessing Reliability against Soft Error in SoC
Xiaozhi Du, Dongyang Luo, Kailun Shi, Chaohui He, Shuhuan Liu |
J. Electron. Test. | 4 |
| 2017 | Heavy ion micro-beam study of single-event transient (SET) in SiGe heterjunction bipolar transistor
Fengqi Zhang, Chaohui He, Yunyi Yan, Linxia Zhang |
Sci. China Inf. Sci. | 4 |