Demo Data from VLDB 2026 / reviewers in the wild / expert
Ruiqiang Song
dblp:162/7163
· DBLP profile ↗
3ranked-venue papers
2as first author
0since 2021 · last 2017
0000-0002-6171-343XORCID · corroborated
Domains — the database's venue-derived domains; a paper can count in several
Applied, interdisciplinary, general and emerging computing · 3 · 2 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
3 papers |
Hardware reliability and fault tolerance · 88% Integrated circuit design · 12% |
Topics — the 6 heaviest of 6, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Hardware reliability and fault tolerance
soft errors |
0.8 | 3 | 2017 | Modeling the impact of process and operation variations on the soft error rate of digital circuits · Sci. China Inf. Sci. 2017 Comparison of single-event upset generated by heavy ion and pulsed laser · Sci. China Inf. Sci. 2017 Flip-flops soft error rate evaluation approach considering internal single-event transient · Sci. China Inf. Sci. 2015 |
Hardware reliability and fault tolerance › soft errors
single-event upset |
0.3 | 1 | 2017 | Comparison of single-event upset generated by heavy ion and pulsed laser · Sci. China Inf. Sci. 2017 |
Hardware reliability and fault tolerance › soft errors
soft error rate |
0.3 | 1 | 2017 | Modeling the impact of process and operation variations on the soft error rate of digital circuits · Sci. China Inf. Sci. 2017 |
Hardware reliability and fault tolerance › soft errors
single event transient |
0.2 | 1 | 2015 | Flip-flops soft error rate evaluation approach considering internal single-event transient · Sci. China Inf. Sci. 2015 |
Integrated circuit design
digital circuit design |
0.2 | 2 | 2017 | Modeling the impact of process and operation variations on the soft error rate of digital circuits · Sci. China Inf. Sci. 2017 Flip-flops soft error rate evaluation approach considering internal single-event transient · Sci. China Inf. Sci. 2015 |
Integrated circuit design › digital circuit design › sequential circuit design
flip-flop |
0.1 | 1 | 2015 | Flip-flops soft error rate evaluation approach considering internal single-event transient · Sci. China Inf. Sci. 2015 |
Methods — techniques the papers use, named apart from their topics
pulsed laser testing · 0.3process variation modeling · 0.3operation variation modeling · 0.3heavy ion testing · 0.3soft error rate evaluation · 0.2
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2017 | Comparison of single-event upset generated by heavy ion and pulsed laser
Ruiqiang Song, Jianwei Han, Yaqing Chi, Rui Chen 0038, Chunmei Hu, Yingqi Ma, Shipeng Shangguan |
Sci. China Inf. Sci. | 2 |
| 2017 | Modeling the impact of process and operation variations on the soft error rate of digital circuits
Ruiqiang Song, Shuming Chen, Yaqing Chi |
Sci. China Inf. Sci. | 1 |
| 2015 | Flip-flops soft error rate evaluation approach considering internal single-event transient
Ruiqiang Song, Shuming Chen, Yibai He, Yankang Du |
Sci. China Inf. Sci. | 1 |