Since integrating memory blocks on-chip became affordable, embedded logic analysis has been used extensively for post-silicon validation and debugging. Deciding at design time which signals to be traceable at the post-silicon phase, has been posed as an algorithmic problem a decade ago. The primary focus of the subsequent approaches on this topic was to restore as much data as possible within a software simulator in order to facilitate the analysis of functional bugs, assuming there are no electrically induced design errors, e.g., bit-flips. In this paper, we show that analyzing post-silicon traces can also aid with the identification bit-flips. We present a new trace signals selection algorithm that is driven by the detection of bit-flips.

Analyzing the traces that are collected on-chip is an effective method employed during post-silicon validation. Deciding at design time which signals to trace at the post-silicon phase, has been posed as an algorithmic problem several years ago. The primary focus of the subsequent approaches on this topic was to restore data in order to facilitate functional debugging. In this paper we show that analyzing post-silicon traces can also aid with the identification of electrically-induced design errors, e.g., bit-flips. We present a new trace signals selection algorithm that is driven by the detection of bit-flips.