Demo Data from VLDB 2026 / reviewers in the wild / expert
R. L. Maiasz
dblp:17/3375
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 1987
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 91% Integrated circuit design · 9% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › physical design
cell layout |
0.0 | 1 | 1987 | Layout Optimization of CMOS Functional Cells · DAC 1987 |
Electronic design automation › physical design › cell layout
CMOS cell layout |
0.0 | 1 | 1987 | Layout Optimization of CMOS Functional Cells · DAC 1987 |
Electronic design automation
physical design |
0.0 | 1 | 1987 | Layout Optimization of CMOS Functional Cells · DAC 1987 |
Integrated circuit design › ASIC design
standard cell design |
0.0 | 1 | 1987 | Layout Optimization of CMOS Functional Cells · DAC 1987 |
Methods — techniques the papers use, named apart from their topics
graph-theoretical framework · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1987 | Layout Optimization of CMOS Functional CellsabstractAn optimal non-exhaustive method of minimizing the layout area of complementary series-parallel CMOS functional cells in the standard-cell style is presented. This generalizes earlier work of Uehara and van Cleemput which is heuristic and nonoptimal. A complete graph-theoretical framework for CMOS cell layout is developed and illustrated. The approach demonstrates a new class of graph-based algebras which characterize this layout problem. R. L. Maiasz, John P. Hayes |
DAC | 1 |