VLDB 2026 Research / reviewers in the wild / expert
K. C. Y. Mei
dblp:173/1841
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 1974
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 100% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › hardware verification and test › fault modeling
bridging fault |
0.0 | 1 | 1974 | Bridging and Stuck-At Faults · IEEE Trans. Computers 1974 |
Electronic design automation › hardware verification and test
fault modeling |
0.0 | 1 | 1974 | Bridging and Stuck-At Faults · IEEE Trans. Computers 1974 |
Electronic design automation
hardware verification and test |
0.0 | 1 | 1974 | Bridging and Stuck-At Faults · IEEE Trans. Computers 1974 |
Electronic design automation › hardware verification and test › fault testing
stuck-at fault testing |
0.0 | 1 | 1974 | Bridging and Stuck-At Faults · IEEE Trans. Computers 1974 |
Methods — techniques the papers use, named apart from their topics
fault modeling · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1974 | Bridging and Stuck-At FaultsabstractThe commonly used stuck-at fault fails to model logic circuit shorts. Bridging faults are defined to model these circuit mal-functions. This model is based on wired logic which is a characteristic of many logic families such as resistor-transistor logic (RTL), diode transistor logic (DTL), emitter-coupled logic (ECL), etc. It does not apply to TTL circuits. The model also limits to fan-out-free leads. K. C. Y. Mei |
IEEE Trans. Computers | 1 |