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YiFeng Wu

dblp:176/8630 · DBLP profile ↗
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2ranked-venue papers
0as first author
0since 2021 · last 2008
0000-0001-8572-1584ORCID · corroborated

Domains — the database's venue-derived domains; a paper can count in several

Applied, interdisciplinary, general and emerging computing · 2

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
2 papers
Integrated circuit design · 91% Hardware reliability and fault tolerance · 9%

Topics — the 5 heaviest of 5, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Integrated circuit design › semiconductor devices
wide bandgap semiconductor devices
0.122008
GaN-Based RF Power Devices and Amplifiers · Proc. IEEE 2008
AlGaN/GaN HEMTs-an overview of device operation and applications · Proc. IEEE 2002
Integrated circuit design › radio-frequency circuit design
monolithic microwave integrated circuit
0.112008
GaN-Based RF Power Devices and Amplifiers · Proc. IEEE 2008
Integrated circuit design › semiconductor devices › GaN HEMT
AlGaN/GaN HEMT
0.012002
AlGaN/GaN HEMTs-an overview of device operation and applications · Proc. IEEE 2002
Hardware reliability and fault tolerance
device reliability
0.012008
GaN-Based RF Power Devices and Amplifiers · Proc. IEEE 2008
Integrated circuit design
power electronics
0.012002
AlGaN/GaN HEMTs-an overview of device operation and applications · Proc. IEEE 2002

Methods — techniques the papers use, named apart from their topics

material processing · 0.1epitaxial growth · 0.1
YearPublicationVenuePosition
2008 GaN-Based RF Power Devices and Amplifiers
abstract
The rapid development of the RF power electronics requires the introduction of wide bandgap material due to its potential in high output power density, high operation voltage and high input impedance. GaN-based RF power devices have made substantial progresses in the last decade. This paper attempts to review the latest developments of the GaN HEMT technologies, including material growth, processing technologies, device epitaxial structures and MMIC designs, to achieve the state-of-the-art microwave and millimeter-wave performance. The reliability and manufacturing challenges are also discussed.
Umesh K. Mishra, Likun Shen, Thomas E. Kazior, YiFeng Wu
Proc. IEEE4
2002 AlGaN/GaN HEMTs-an overview of device operation and applications
abstract
Wide bandgap semiconductors are extremely attractive for the gamut of power electronics applications from power conditioning to microwave transmitters for communications and radar. Of the various materials and device technologies, the AlGaN/GaN high-electron mobility transistor seems the most promising. This paper attempts to present the status of the technology and the market with a view of highlighting both the progress and the remaining problems.
Umesh K. Mishra, Primit Parikh, YiFeng Wu
Proc. IEEE3