Demo Data from VLDB 2026 / reviewers in the wild / expert
YiFeng Wu
dblp:176/8630
· DBLP profile ↗
2ranked-venue papers
0as first author
0since 2021 · last 2008
0000-0001-8572-1584ORCID · corroborated
Domains — the database's venue-derived domains; a paper can count in several
Applied, interdisciplinary, general and emerging computing · 2
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
2 papers |
Integrated circuit design · 91% Hardware reliability and fault tolerance · 9% |
Topics — the 5 heaviest of 5, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Integrated circuit design › semiconductor devices
wide bandgap semiconductor devices |
0.1 | 2 | 2008 | GaN-Based RF Power Devices and Amplifiers · Proc. IEEE 2008 AlGaN/GaN HEMTs-an overview of device operation and applications · Proc. IEEE 2002 |
Integrated circuit design › radio-frequency circuit design
monolithic microwave integrated circuit |
0.1 | 1 | 2008 | GaN-Based RF Power Devices and Amplifiers · Proc. IEEE 2008 |
Integrated circuit design › semiconductor devices › GaN HEMT
AlGaN/GaN HEMT |
0.0 | 1 | 2002 | AlGaN/GaN HEMTs-an overview of device operation and applications · Proc. IEEE 2002 |
Hardware reliability and fault tolerance
device reliability |
0.0 | 1 | 2008 | GaN-Based RF Power Devices and Amplifiers · Proc. IEEE 2008 |
Integrated circuit design
power electronics |
0.0 | 1 | 2002 | AlGaN/GaN HEMTs-an overview of device operation and applications · Proc. IEEE 2002 |
Methods — techniques the papers use, named apart from their topics
material processing · 0.1epitaxial growth · 0.1
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2008 | GaN-Based RF Power Devices and AmplifiersabstractThe rapid development of the RF power electronics requires the introduction of wide bandgap material due to its potential in high output power density, high operation voltage and high input impedance. GaN-based RF power devices have made substantial progresses in the last decade. This paper attempts to review the latest developments of the GaN HEMT technologies, including material growth, processing technologies, device epitaxial structures and MMIC designs, to achieve the state-of-the-art microwave and millimeter-wave performance. The reliability and manufacturing challenges are also discussed. Umesh K. Mishra, Likun Shen, Thomas E. Kazior, YiFeng Wu |
Proc. IEEE | 4 |
| 2002 | AlGaN/GaN HEMTs-an overview of device operation and applicationsabstractWide bandgap semiconductors are extremely attractive for the gamut of power electronics applications from power conditioning to microwave transmitters for communications and radar. Of the various materials and device technologies, the AlGaN/GaN high-electron mobility transistor seems the most promising. This paper attempts to present the status of the technology and the market with a view of highlighting both the progress and the remaining problems. Umesh K. Mishra, Primit Parikh, YiFeng Wu |
Proc. IEEE | 3 |