Demo Data from VLDB 2026 / reviewers in the wild / expert
Gordon E. Whitney
dblp:178/3945
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 1971
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 100% |
Topics — the 3 heaviest of 3, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › hardware verification and test
fault analysis |
0.0 | 1 | 1971 | Algebraic Fault Analysis for Constrained Combinational Networks · IEEE Trans. Computers 1971 |
Electronic design automation
hardware verification and test |
0.0 | 1 | 1971 | Algebraic Fault Analysis for Constrained Combinational Networks · IEEE Trans. Computers 1971 |
Electronic design automation › logic synthesis
combinational network |
0.0 | 1 | 1971 | Algebraic Fault Analysis for Constrained Combinational Networks · IEEE Trans. Computers 1971 |
Methods — techniques the papers use, named apart from their topics
boolean equation system · 0.0algebraic fault analysis · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1971 | Algebraic Fault Analysis for Constrained Combinational NetworksabstractA sequential machine that processes its inputs without changing state can be represented as a constrained combinational network. A system of Boolean equations that represent such a network must include assertions that formalize the required constraints. These constraints can be expressed as assertions about certain gate inputs and certain gate outputs within the network. In such networks, redundant and partially redundant gates are not pathological. The fault analysis method presented provides for the testing of both sides of an irredundant gate and for the detectable side of a partially redundant gate. Gordon E. Whitney |
IEEE Trans. Computers | 1 |