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J. Reese Brown Jr.

dblp:180/3359 · DBLP profile ↗
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1ranked-venue papers
1as first author
0since 2021 · last 1966
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Memory systems · 100%

Topics — the 2 heaviest of 2, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Memory systems
magnetic core memory		 0.011966
First-and Second-Order Ferrite Memory Core Characteristics and Their Relationship to System Performance · IEEE Trans. Electron. Comput. 1966
Memory systems
memory architecture		 0.011966
First-and Second-Order Ferrite Memory Core Characteristics and Their Relationship to System Performance · IEEE Trans. Electron. Comput. 1966
YearPublicationVenuePosition
1966 First-and Second-Order Ferrite Memory Core Characteristics and Their Relationship to System Performance
abstract
The characteristics of ferrite memory cores are discussed and it is shown how these characteristics relate to the performance of memories with different organizations. First to be discussed are the different memory organizations (3D, 2½D, and 2D) in which ferrite cores are used. The sense-digit plane configurations for typical systems are discussed and illustrated. Also discussed and illustrated are the primary and secondary response characteristics and it is shown how these characteristics affect the sense output voltage. Test procedures for determining these characteristics, without the necessity for building a complete memory plane, are given. The general considerations are discussed for selecting a core for an application using these test results; this is illustrated with a tabulation of results derived from the testing of a series of 30-mil memory cores. The paper concludes with a brief discussion of core stress sensitivity and temperature characteristics.
J. Reese Brown Jr.
 IEEE Trans. Electron. Comput.1