Demo Data from VLDB 2026 / reviewers in the wild / expert
N. S. Parezanovic
dblp:180/6457
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 1965
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Interdisciplinary, comprehensive, and emerging computing
1 paper |
Computational science and engineering · 100% | |
| Theoretical computer science
1 paper |
Mathematical optimization · 100% |
Topics — the 2 heaviest of 2, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Computational science and engineering
analog computation |
0.0 | 1 | 1965 | Sensitivity of Dynamic Systems to Parameters Which Increase the Order of Mathematical Models · IEEE Trans. Electron. Comput. 1965 |
Mathematical optimization › control theory
model identification |
0.0 | 1 | 1965 | Sensitivity of Dynamic Systems to Parameters Which Increase the Order of Mathematical Models · IEEE Trans. Electron. Comput. 1965 |
Methods — techniques the papers use, named apart from their topics
sensitivity function computation · 0.0error analysis · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1965 | Sensitivity of Dynamic Systems to Parameters Which Increase the Order of Mathematical ModelsabstractThe paper describes a procedure applicable to analog computers for obtaining the sensitivity function of dynamic systems to parameters that change the order of differential equations. The procedure developed is applied to a problem in error analysis and to a problem in steepest ascent model identification. For purposes of comparison, the sensitivity with respect to normal parameters is also presented. Rajko Tomovic, N. S. Parezanovic, Michael J. Merritt |
IEEE Trans. Electron. Comput. | 2 |