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S. M. Bawin

dblp:180/6462 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 1965
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Interdisciplinary, comprehensive, and emerging computing
1 paper
Computational science and engineering · 100%

Topics — the 2 heaviest of 2, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Computational science and engineering
numerical simulation
0.011965
Frequency Analysis of Truncation Errors in RC Networks · IEEE Trans. Electron. Comput. 1965
Computational science and engineering
partial differential equation solver
0.011965
Frequency Analysis of Truncation Errors in RC Networks · IEEE Trans. Electron. Comput. 1965

Methods — techniques the papers use, named apart from their topics

lumped modeling · 0.0frequency-domain error analysis · 0.0
YearPublicationVenuePosition
1965 Frequency Analysis of Truncation Errors in RC Networks
abstract
This paper provides guidelines for the discretizing of the space variables in continuous systems governed by the second-order partial differential diffusion equation. Such lumping is necessary in all digital and many analog methods. To analyze the truncation error resulting from lumped analog or digital modelling, the authors demonstrate the applicability of an upper-bound criterion combining amplitude and phase errors in the frequency domain. Dimensionless variables are used to compare lumped networks corresponding to one-dimensional continuous systems. Computer results are presented which relate truncation error to frequency for lumped models containing one to ten sections.
Jacques J. Vidal, S. M. Bawin
IEEE Trans. Electron. Comput.2