Demo Data from VLDB 2026 / reviewers in the wild / expert
S. M. Bawin
dblp:180/6462
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 1965
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Interdisciplinary, comprehensive, and emerging computing
1 paper |
Computational science and engineering · 100% |
Topics — the 2 heaviest of 2, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Computational science and engineering
numerical simulation |
0.0 | 1 | 1965 | Frequency Analysis of Truncation Errors in RC Networks · IEEE Trans. Electron. Comput. 1965 |
Computational science and engineering
partial differential equation solver |
0.0 | 1 | 1965 | Frequency Analysis of Truncation Errors in RC Networks · IEEE Trans. Electron. Comput. 1965 |
Methods — techniques the papers use, named apart from their topics
lumped modeling · 0.0frequency-domain error analysis · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1965 | Frequency Analysis of Truncation Errors in RC NetworksabstractThis paper provides guidelines for the discretizing of the space variables in continuous systems governed by the second-order partial differential diffusion equation. Such lumping is necessary in all digital and many analog methods. To analyze the truncation error resulting from lumped analog or digital modelling, the authors demonstrate the applicability of an upper-bound criterion combining amplitude and phase errors in the frequency domain. Dimensionless variables are used to compare lumped networks corresponding to one-dimensional continuous systems. Computer results are presented which relate truncation error to frequency for lumped models containing one to ten sections. Jacques J. Vidal, S. M. Bawin |
IEEE Trans. Electron. Comput. | 2 |