Demo Data from VLDB 2026 / reviewers in the wild / expert
Robert M. Tillman
dblp:182/9818
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 1960
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Memory systems · 100% |
Topics — the 3 heaviest of 3, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Memory systems
magnetic core memory |
0.0 | 1 | 1960 | FluxlokߞA Nondestructive, Random-Access Electrically Alterable: High-Speed Memory Technique Using Standard Ferrite Memory Cores · IRE Trans. Electron. Comput. 1960 |
Memory systems › magnetic core memory
nondestructive readout |
0.0 | 1 | 1960 | FluxlokߞA Nondestructive, Random-Access Electrically Alterable: High-Speed Memory Technique Using Standard Ferrite Memory Cores · IRE Trans. Electron. Comput. 1960 |
Memory systems
random-access memory |
0.0 | 1 | 1960 | FluxlokߞA Nondestructive, Random-Access Electrically Alterable: High-Speed Memory Technique Using Standard Ferrite Memory Cores · IRE Trans. Electron. Comput. 1960 |
Methods — techniques the papers use, named apart from their topics
cross-field magnetization · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1960 | FluxlokߞA Nondestructive, Random-Access Electrically Alterable: High-Speed Memory Technique Using Standard Ferrite Memory CoresabstractThe Fluxlok memory technique uses the principle of cross-field magnetization to achieve the nondestructive sensing of the information state of standard, readily available, ferrite memory cores in a simply wired memory plane. Bipolar output (ONE and ZERO) signals are obtained at the rate of rise of the READ pulse. The signals are unaffected by test temperatures of from ߝ65°C to +100°C. Coincident current WRITE operation or an inherent orthogonal field WRITE may be used. A 2-mc 64-word Fluxlok memory test vehicle is described. Robert M. Tillman |
IRE Trans. Electron. Comput. | 1 |