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M. J. Lahart

dblp:20/9411 · DBLP profile ↗
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1ranked-venue papers
1as first author
0since 2021 · last 1984
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Artificial intelligence and machine learning · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer graphics and multimedia
1 paper
Multimedia analysis and retrieval · 100%
Theoretical computer science
1 paper
Information theory · 100%

Topics — the 2 heaviest of 2, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Multimedia analysis and retrieval
image analysis
0.011984
Estimation of Error Rates in Classification of Distorted Imagery · IEEE Trans. Pattern Anal. Mach. Intell. 1984
Information theory
pattern recognition
0.011984
Estimation of Error Rates in Classification of Distorted Imagery · IEEE Trans. Pattern Anal. Mach. Intell. 1984

Methods — techniques the papers use, named apart from their topics

gaussian modeling · 0.0fourier analysis · 0.0
YearPublicationVenuePosition
1984 Estimation of Error Rates in Classification of Distorted Imagery
abstract
This correspondence considers the problem of matching image data to a large library of objects when the image is distorted. Two types of distortions are considered: blur-type, in which a transfer function is applied to Fourier components of the image, and scale-type, in which each Fourier component is mapped into another. The objects of the library are assumed to be normally distributed in an appropriate feature space. Approximate expressions are developed for classification error rates as a function of noise. The error rates they predict are compared with those from classification of artificial data, generated by a Gaussian random number generator, and with error rates from classification of actual data. It is demonstrated that, for classification purposes, distortions can be characterized by a small number of parameters.
M. J. Lahart
IEEE Trans. Pattern Anal. Mach. Intell.1