VLDB 2026 Research / reviewers in the wild / expert
Elizabeth A. Dobisz
dblp:202/4277
· DBLP profile ↗
2ranked-venue papers
1as first author
0since 2021 · last 2008
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Applied, interdisciplinary, general and emerging computing · 2 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
2 papers |
Storage systems · 67% Electronic design automation · 33% |
Topics — the 7 heaviest of 7, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Storage systems › magnetic recording
bit-patterned media |
0.1 | 1 | 2008 | Patterned Media: Nanofabrication Challenges of Future Disk Drives · Proc. IEEE 2008 |
Storage systems
magnetic storage |
0.1 | 1 | 2008 | Patterned Media: Nanofabrication Challenges of Future Disk Drives · Proc. IEEE 2008 |
Electronic design automation
nanofabrication |
0.0 | 2 | 2008 | Patterned Media: Nanofabrication Challenges of Future Disk Drives · Proc. IEEE 2008 Nanostructure patterning · Proc. IEEE 1991 |
Electronic design automation › nanofabrication
nanoimprint lithography |
0.0 | 1 | 2008 | Patterned Media: Nanofabrication Challenges of Future Disk Drives · Proc. IEEE 2008 |
Electronic design automation › physical design › lithography
electron beam lithography |
0.0 | 1 | 1991 | Nanostructure patterning · Proc. IEEE 1991 |
Electronic design automation › physical design
lithography |
0.0 | 1 | 1991 | Nanostructure patterning · Proc. IEEE 1991 |
Electronic design automation › physical design
optical proximity correction |
0.0 | 1 | 1991 | Nanostructure patterning · Proc. IEEE 1991 |
Methods — techniques the papers use, named apart from their topics
nanoimprint lithography · 0.1electron beam lithography · 0.1
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2008 | Patterned Media: Nanofabrication Challenges of Future Disk DrivesabstractScaling of the bit size in conventional magnetic recording media is becoming increasingly difficult due to the superparamagnetic limit. Innovations in magnetic recording technology are emerging to enable the continued growth in bit areal density. Thermal stability problems of conventional granular media can be greatly helped by patterning single domain magnetic islands for each magnetic bit. Fabrication of patterned media requires application of nanoimprint lithography for high-volume production of patterned media disks and high-resolution electron beam lithography for fabrication of the nanoimprint masters. We discuss the approaches and the many challenges to the implementation of patterned media disks. Elizabeth A. Dobisz, Zvonomir Z. Bandic, Tsai-Wei Wu, Thomas Albrecht |
Proc. IEEE | 1 |
| 1991 | Nanostructure patterningabstractResearch at the US Naval Research Laboratory (NRL) in the lithography, patterning, and fabrication of structures of nanometer scale dimensions is reviewed. Electron-beam (e-beam) lithography at high (50 keV) and low (5 eV) energies on resist systems developed at NRL is described. The low energy lithography takes advantage of the spatially confined e-beam available in a scanning tunneling microscope type probe. This instrument allows an in situ exposure and characterization of an e-beam sensitive material. A novel approach for implementing dose correction for proximity effects in e-beam lithography is presented using an error measure based on the physical realities of lithography. The compositional disordering of GaAs-Ga/sub x/Al/sub 1-x/As heterostructures as a technique for pattern replication is described. Introducing silicon into the heterostructure (by implantation or diffusion) enhances the aluminum and gallium interdiffusion which can be used for patterning. A complete bibliography of recently published results is included.> Christie R. K. Marrian, Elizabeth A. Dobisz, Martin C. Peckeur |
Proc. IEEE | 2 |