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Akira Motohara

dblp:22/3743 · DBLP profile ↗
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4ranked-venue papers
3as first author
0since 2021 · last 1999
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 4 · 3 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
2 papers
Electronic design automation · 100%

Topics — the 5 heaviest of 5, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
hardware verification and test		 0.021993
A State Traversal Algorithm Using a State Covariance Matrix · DAC 1993
An Approach to Fast Hierarchical Fault Simulation · DAC 1988
Electronic design automation › hardware verification and test › formal verification
finite state machine traversal		 0.011993
A State Traversal Algorithm Using a State Covariance Matrix · DAC 1993
Electronic design automation › model checking
state space traversal		 0.011993
A State Traversal Algorithm Using a State Covariance Matrix · DAC 1993
Electronic design automation › hardware verification and test
fault simulation		 0.011988
An Approach to Fast Hierarchical Fault Simulation · DAC 1988
Electronic design automation › hardware verification and test › fault simulation
hierarchical fault simulation		 0.011988
An Approach to Fast Hierarchical Fault Simulation · DAC 1988

Methods — techniques the papers use, named apart from their topics

state covariance matrix · 0.0
YearPublicationVenuePosition
1999 Practical Application of Automated Fault Diagnosis for Stuck-at, Bridging, and Measurement Condition Dependent Faults in Fully Scanned Sequential Circuits
abstract
A practical fault diagnosis system based on combination automatic test pattern generation (ATPG) and fault simulation is described. Our fault diagnosis system deals with conventional stuck-at and bridging faults, as well as measurement condition dependent (MCD) faults in order to diagnose those faults causing different behavior with measurement condition such as supply voltage and temperature, using single stuck-at based diagnosis techniques. Experimental results with a practical very deep submicron (VDSM) LSI circuit shows that a defective chip can be efficiently diagnosed using our diagnostic algorithm and newly proposed MCD fault model.
Reisuke Shimoda, Takaki Yoshida, Masafumi Watari, Yasuhiro Toyota, Kiyokazu Nishi, Akira Motohara
 Asian Test Symposium6
1995 Design for testability using register-transfer level partial scan selection
abstract
No abstract available.
Akira Motohara, Sadami Takeoka, Toshinori Hosokawa, Mitsuyasu Ohta, Yuji Takai, Michihiro Matsumoto, Michiaki Muraoka
 ASP-DAC1
1993 A State Traversal Algorithm Using a State Covariance Matrix
abstract
Article A state traversal algorithm using a state covariance matrix Share on Authors: Akira Motohara View Profile , Toshinori Hosokawa View Profile , Michiaki Muraoka View Profile , Hidetsugu Maekawa View Profile , Kazuhiro Kayashima View Profile , Yasuharu Shimeki View Profile , Seichi Shin View Profile Authors Info & Claims DAC '93: Proceedings of the 30th international Design Automation ConferenceJuly 1993 Pages 97–101https://doi.org/10.1145/157485.164590Online:01 July 1993Publication History 7citation198DownloadsMetricsTotal Citations7Total Downloads198Last 12 Months1Last 6 weeks0 Get Citation AlertsNew Citation Alert added!This alert has been successfully added and will be sent to:You will be notified whenever a record that you have chosen has been cited.To manage your alert preferences, click on the button below.Manage my AlertsNew Citation Alert!Please log in to your account Save to BinderSave to BinderCreate a New BinderNameCancelCreateExport CitationPublisher SiteGet Access
Akira Motohara, Toshinori Hosokawa, Michiaki Muraoka, Hidetsugu Maekawa, Kazuhiro Kayashima, Yasuharu Shimeki, Seichi Shin
 DAC1
1988 An Approach to Fast Hierarchical Fault Simulation
Akira Motohara, Motohide Murakami, Miki Urano, Yasuo Masuda, Masahide Sugano
 DAC1