This paper proposes four logic-chain bridging fault models, which involve one net in the combinational logic and the other net in the scan chain. Test results of logic-chain bridging faults, unlike existing scan chain fault models, depend on the previous scan inputs as well as primary inputs. A bridging pair extraction algorithm is proposed to quickly extract bridging pairs from the layout. The paper proposed two sets of structural reduction techniques so that runtime is very short. Experimental results on ISCAS benchmark circuits show that, on the average, logic-chain bridging faults can be diagnosed within an accuracy of four bridging pairs. The techniques are still applicable when there are only 10 failing patterns due to limited ATE failure memory. This paper demonstrates the feasibility to diagnose logic-chain bridging faults by software.

We propose five logic-to-chain bridging fault models, which involve one net in the combinational logic and the other net in the scan chain. Test results of logic-to-chain bridging faults, unlike any existing fault, depend on the previous scan inputs as well as primary inputs. An accurate diagnosis technique is presented to locate logic-to-chain bridging faults. In addition, a bridging pair extraction algorithm is proposed to quickly extract bridging net pairs from the layout. Experimental results on ISCAS benchmark circuits show that, on the average, logic-to-chain bridging faults can be diagnosed within an accuracy of three bridging pairs. The technique is still applicable when only ten failing patterns are recorded on the tester.

A diagnosis technique is presented to locate multiple timing faults in scan chains. Jump simulation is a novel parallel simulation technique which quickly searches for the upper and the lower bounds of every individual fault. The proposed technique takes into account the interaction of multiple faults so the diagnosis results are deterministic, not probabilistic. This technique is very useful in the production test environment because it requires only regular automated test pattern generator patterns, not specialized diagnosis patterns. Experiments on ISCAS'89 benchmark circuits show that this technique can successfully pinpoint almost every single one of 16 hold-time faults in a scan chain of more than 800 scan cells. The proposed technique is still effective when failure data are limited or faults are clustered.

Abstract We propose an approach to visualizing the scientific world and its evolution by constructing minimum spanning trees (MSTs) and a two‐dimensional map of scientific journals using the database of the Science Citation Index (SCI) during 1994–2001. The structures of constructed MSTs are consistent with the sorting of SCI categories. The map of science is constructed based on our MST results. Such a map shows the relation among various knowledge clusters and their citation properties. The temporal evolution of the scientific world can also be delineated in the map. In particular, this map clearly shows a linear structure of the scientific world, which contains three major domains including physical sciences, life sciences, and medical sciences. The interaction of various knowledge fields can be clearly seen from this scientific world map. This approach can be applied to various levels of knowledge domains.