While logic locking is a promising defense to protect hardware designs, many attacks have been shown to undermine its security by retrieving the secret key. All the powerful attacks rely on a working chip, i.e., an oracle, and in particular, heavily use the test access. The proposed technique DisORC turns the oracle into a dishonest one whenever a potential attack is detected. DisORC works on the premise that structural testing of chips need not be performed with the correct functionality. We implement this capability by adding circuitry around a logic-locked design that reconfigures its functionality upon detecting access to scan chains. Any attempt to access scan chains disconnects the secret key from the circuit, and clears all of its traces, isolating and securing it. We also pair this defense with a truly random logic locking (TRLL) scheme that makes random decisions in inserting key gates and retaining signal polarities without relying on any logic synthesis technique to perform bubble pushing. Any netlist analysis-based attack, known or anticipated, will then learn nothing useful to infer the key values. The combined defense DisORC + TRLL thwarts oracle-based and netlist analysis-based attacks while delivering sufficient corruption levels at the outputs. We also show that the proposed defense is cost effective and can be integrated into the design flow easily. The proposed logic locking defense provides protection against untrusted foundry, testing facility, end users, and any combination of them colluding together.

Logic locking has received a lot of attention in the literature due to its very attractive hardware-security characteristics: it can protect against IP piracy and overproduction throughout the whole IC supply chain. However, a large class of logic-locking attacks, the oracle-based ones, take advantage of a functional copy of the chip, the oracle, to extract the key that protects the chip. So far, the techniques dealing with oraclebased attacks focus on the netlist that the attacker possesses, assuming that the oracle is always available. For this reason, they are usually overcome by new attacks. In this paper, we propose a hardware security scheme that targets the protection of the oracle circuit, by locking the circuit when the, necessary for setting the inputs and observing the outputs, scan in/out process begins. Hence, no correct input/output pairs can be acquired to perform the attacks. The proposed scheme is not based on controlling global signals like test enable or scan enable, whose values can be easily suppressed by the attacker. Security threats are identified, discussed and addressed. The developed scheme is combined with a traditional logic locking technique with high output corruptibility, to achieve increased levels of protection.

Logic locking has been successfully used for protecting digital circuits against IC piracy. Modern logic locking techniques offer significant security advantages, like high corruptibility of the locked circuit's outputs when applying random keys (= 50% Hamming Distance-HD-compared to the correct outputs), or resilience to the key-sensitization attack. However, there are no techniques to combine both advantages. To solve this problem, weighted logic locking is proposed in this paper. Instead of the conventional single key-input control, the proposed technique uses multiple key-inputs to control every key-gate. This new, weighted key-gate control is by construction immune to the key-sensitization attack, while by employing a new key-gate insertion metric, 50% HD is obtained even for circuits with many outputs. Additionally, weighted key-gate control increases dramatically the probability of any key-gate to corrupt the circuit's values, which means that fewer key-gates are needed to achieve 50% HD. This way, execution time for locking the circuits is drastically reduced. Apart from these advantages, weighted logic locking is fairly “generic” and can be combined with other techniques to improve security (e.g., to thwart the SAT attack).

Network-on-Chip (NoC) design tries to keep a balance between network performance and physical implementation flexibility. The adoption of Virtual Channels (VC) holds promise for scalable NoC design. VCs allow for traffic separation and isolation, enable deadlock avoidance and improve network performance. In this paper, we present ElastiNoC, a novel distributed VC-based router architecture that enjoys all the benefits offered by VCs and leads to efficient silicon-aware implementations. The proposed architecture utilizes an efficient buffering strategy and allows for modular pipelined organizations that increase the clock frequency. Moreover, it offers maximum freedom in terms of physical placement, by allowing the NoC components to be physically spread throughout the chip, irrespective of the network topology. The combined effect of all supported features enables significant delay reductions under equal performance, when compared to state-of-the-art VC-based NoC implementations. Moreover, the careful addition of self-test structures allows ElastiNoC to enjoy fully distributed Built-In Self Testability (BIST), where testing unfolds in phases and reaches high fault coverage with small test application time.

On-chip interconnection networks simplify the increasingly challenging process of integrating multiple functional modules in modern Systems-on-Chip (SoCs). The routers are the heart and backbone of such networks, and their implementation cost (area/power) determines the cost of the whole network. In this paper, we explore the time-multiplexing of a router's output ports via a folded datapath and control, where only a portion of the router's arbiters and crossbar multiplexers are implemented, as a means to reduce the cost of the router without sacrificing performance. In parallel, we propose the incorporation of the switch-folded routers into a new form of heterogeneous network topologies, comprising both folded (time-multiplexed) and unfolded (conventional) routers, which leads to effectively the same network performance, but at lower area/energy, as compared to topologies composed entirely of full-fledged wormhole or virtual-channel-based router designs.

Large systems-on-chip (SoCs) and chip multiprocessors (CMPs), incorporating tens to hundreds of cores, create a significant integration challenge. Interconnecting a huge amount of architectural modules in an efficient manner, calls for scalable solutions that would offer both high throughput and low-latency communication. The switches are the basic building blocks of such interconnection networks and their design critically affects the performance of the whole system. So far, innovation in switch design relied mostly to architecture-level solutions that took for granted the characteristics of the main building blocks of the switch, such as the buffers, the routing logic, the arbiters, the crossbar's multiplexers, and without any further modifications, tried to reorganize them in a more efficient way. Although such pure high-level design has produced highly efficient switches, the question of how much better the switch would be if better building blocks were available remains to be investigated. In this paper, we try to partially answer this question by explicitly targeting the design from scratch of new soft macros that can handle concurrently arbitration and multiplexing and can be parameterized with the number of inputs, the data width, and the priority selection policy. With the proposed macros, switch allocation, which employs either standard round robin or more sophisticated arbitration policies with significant network-throughput benefits, and switch traversal, can be performed simultaneously in the same cycle, while still offering energy-delay efficient implementations.

On-chip interconnection networks simplify the integration of complex system-on-chips. The switches are the basic building blocks of such networks and their design critically affects the performance of the whole system. The transfer of data between the inputs and the outputs of the switch is performed by the crossbar, whose active connections are decided by the arbiter. In this paper, we design scalable dynamic-priority arbiters that are merged with the crossbar's multiplexers. The proposed RTL macros can adjust to various priority selection policies, while still following the same unified architecture. With this approach, sophisticated arbitration policies that yield significant network-throughput benefits can be implemented with negligible delay cost relative to the standard round-robin policy.

Soft on-FGPA interconnection networks are gaining increasing importance since they simplify the integration of heterogeneous components and offer, at the same time, a modular solution to the complex system-wide communication issues. The switches are the basic building blocks of such interconnection networks and their design critically affects the performance of the whole network. The way data traverse each switch is governed by the operation of the arbiter and the crossbar's multiplexers that need to be efficiently mapped on the FPGA fabric under tight area and delay constraints. This paper explores the design space of an arbiter and a multiplexer as a unified entity and proposes two new circuit alternatives that allow the design of scalable soft FPGA switches.

Defect screening is a major challenge for nanoscale CMOS circuits, especially since many defects cannot be accurately modeled using known fault models. The effectiveness of test methods for such circuits can therefore be measured in terms of the coverage obtained for unmodeled faults. In this paper, we present a new defect-oriented dynamic LFSR reseeding technique for test-data compression. The proposed technique is based on a new output-deviation metric for grading stuck-at patterns derived from LFSR seeds. We show that, compared to standard compression-driven dynamic LFSR reseeding and a previously proposed deviation-based method, higher defect coverage is obtained using stuck-at test cubes without any loss of compression.

Although LFSR reseeding based on test cubes for modeled faults is an efficient test compression approach, it suffers from the drawback of limited, and often unpredictable, coverage of unmodeled defects. We present a new defect coverage-driven window-based LFSR reseeding technique, which offers both high test quality and high compression. The efficiency of the proposed encoding technique in detecting defects is boosted by an efficient “output deviations” metric for grading the calculated LFSR seeds. We show that, compared to standard compression-driven LFSR reseeding, higher defect coverage is obtained without any loss of compression.

Even though test set embedding (TSE) methods offer very high compression efficiency, their excessively long test application times prohibit their use for testing systems-on-chip (SoC). To alleviate this problem we present two new types of linear feedback shift registers (LFSRs), the Single-State-Skip and the Variable-State-Skip LFSRs. Both are normal LFSRs with the addition of the State-Skip circuit, which is used instead of the characteristic-polynomial feedback structure for performing successive jumps of constant and variable length in their state sequence. By using Single-State-Skip LFSRs for testing single or multiple identical cores and Variable-State-Skip LFSRs for testing multiple non-identical cores we get the well-known high compression efficiency of TSE with substantially reduced test sequences, thus bridging the gap between test data compression and TSE methods.

The main disadvantage of LFSR-based compression is that it should be usually combined with a constrained ATPG process, and, as a result, it cannot be effectively applied to IP cores of unknown structure. In this paper, a new LFSR-based compression approach that overcomes this problem is proposed. The proposed method allows each LFSR seed to encode as many slices as possible. For achieving this, a special purpose slice, called stop-slice, that indicates the end of a seed's usage is encoded as the last slice of each seed. Thus, the seeds include by construction the information of where they should stop and, for that reason, we call them self-stoppable. A stop-slice generation procedure is proposed that exploits the inherent test set characteristics and generates stop slices which impose minimum compression overhead. Moreover, the architecture for implementing the proposed technique requires negligible additional hardware overhead compared to the standard LFSR-based architecture. The proposed technique is also accompanied by a seed calculation algorithm that tries to minimize the number of calculated seeds.

We present a new type of linear feedback shift registers, state skip LFSRs. state skip LFSRs are normal LFSRs with the addition of a small linear circuit, the State Skip circuit, which can be used, instead of the characteristic-polynomial feedback structure, for advancing the state of the LFSR. In such a case, the LFSR performs successive jumps of constant length in its state sequence, since the State Skip circuit omits a predetermined number of states by calculating directly the state after them. By using State Skip LFSRs we get the well- known high compression efficiency of test set embedding with substantially reduced test sequences, since the useless parts of the test sequences are dramatically shortened by traversing them in state skip mode. The length of the shortened test sequences approaches that of test data compression methods. A systematic method for minimizing the test sequences of re- seeding-based test set embedding methods, and a low overhead decompression architecture are also presented.

A new statistical test data compression method that is suitable for IP cores of an unknown structure with multiple scan chains is proposed in this paper. Huffman, which is a well-known fixed-to-variable code, is used in this paper as a variable-to-variable code. The precomputed test set of a core is partitioned into variable-length blocks, which are, then, compressed by an efficient Huffman-based encoding procedure with a limited number of codewords. To increase the compression ratio, the same codeword can be reused for encoding compatible blocks of different sizes. Further compression improvements can be achieved by using two very simple test set transformations. A simple and low-overhead decompression architecture is also proposed.

Various compression methods have been proposed for tackling the problem of increasing test-data volume of contemporary, core-based systems. Despite their effectiveness, most of the approaches that are based on classical codes (e.g., run-lengths, Huffman) cannot exploit the test-application-time advantage of multiple-scan-chain cores, since they are not able to perform parallel decompression of the encoded data. In this paper, we take advantage of the inherent parallelism of Huffman decoding and we present a generalized multilevel Huffman-based compression approach that is suitable for cores with multiple scan chains. The size of the encoded data blocks is independent of the slice size (i.e., the number of scan chains), and thus it can be adjusted so as to maximize the compression ratio. At the same time, the parallel data-block decoding ensures the exploitation of most of the scan chains' parallelism. The proposed decompression architecture can be easily modified to suit any Huffman-based compression scheme.

Selective Huffman coding has recently been proposed for efficient test- data compression with low hardware overhead. In this paper, we show that the already proposed encoding scheme is not optimal and we present a new one, proving that it is optimal. Moreover, we compare the two encodings theoretically and we derive a set of conditions which show that, in practical cases, the proposed encoding always offers better compression. In terms of hardware overhead, the new scheme is at least as low-demanding as the old one. The increased compression efficiency, the resulting test-time savings, and the low hardware overhead of the proposed method are also verified experimentally.

A new test-data compression method suitable for cores of unknown structure is introduced in this paper. The proposed method encodes the test data provided by the core vendor using a new, very effective compression scheme based on multilevel Huffman coding. Each Huffman codeword corresponds to three different kinds of information, and thus, significant compression improvements compared to the already known techniques are achieved. A simple architecture is proposed for decoding the compressed data on chip. Its hardware overhead is very low and comparable to that of the most efficient methods in the literature. Moreover, the major part of the decompressor can be shared among different cores, which reduces the hardware overhead of the proposed architecture considerably. Additionally, the proposed technique offers increased probability of detection of unmodeled faults since the majority of the unknown values of the test sets are replaced by pseudorandom data generated by a linear feedback shift register

In this paper we introduce a new test-data compression method for IP cores with unknown structure. The proposed method encodes the test data provided by the core vendor using a new, very effective compression scheme based on multilevel Huffman coding. Specifically, three different kinds of information are compressed using the same Huffman code, and thus significant test data reductions are achieved. A simple architecture is proposed for decoding on-chip the compressed data. Its hardware overhead is very low and comparable to that of the most efficient methods in the literature. Additionally, the proposed technique offers increased probability of detection of unmodeled faults since the majority of the unknown values of the test set are replaced by pseudorandom data generated by an LFSR.

In this paper, a new reseeding architecture for scan-based built-in self-test (BIST), which uses a linear feedback shift register (LFSR) as test pattern generator, is proposed. Multiple cells of the LFSR are utilized as sources for feeding the scan chain of the circuit under test in different test phases. The LFSR generates the same state sequence in all phases, keeping that way the implementation cost low. A seed-selection algorithm is furthermore presented that, taking advantage of the multiphase architecture, manages to significantly reduce the number of the required seeds for achieving complete (100%) fault coverage. The proposed technique can be used either in a full BIST implementation or in a test-resource partitioning scenario, since the test-data storage requirements on the tester are very low. When a full BIST implementation is preferable, the multiphase architecture can also be combined with a dynamic reseeding scheme that uses combinational logic instead of a ROM in order to perform the reseedings. This way the implementation area of the BIST circuitry is further reduced. Experimental results demonstrate the advantages of the proposed LFSR reseeding approach over the already known reseeding techniques.

In this paper a novel reseeding architecture for scan-based BIST, which uses an LFSR as TPG, is proposed. Multiple cells of the LFSR are utilized as sources for feeding the scan chain in different test phases. The LFSR generates the same state sequence in all phases, keeping that way the implementation cost low. Also, a dynamic reseeding scheme is adopted for further reducing the required hardware overhead. A seed-selection algorithm is moreover presented that, taking advantage of the multi-phase architecture, manages to reduce the number of the required seeds for achieving complete (100 %) fault coverage. Experimental results demonstrate the superiority of the proposed LFSR reseeding approach over the already known reseeding techniques.

In this paper, we present a new LFSR reseeding scheme for scan-based BIST, suitable for circuits with random-pattern-resistant faults. The proposed scheme eliminates the need of a ROM for storing the seeds since the reseedings are performed dynamically by inverting some selected bits of the LFSR register. A time-to-market efficient algorithm is also presented for selecting the reseeding points in the test sequence, as well as a proper seed at each point. This algorithm targets complete fault coverage and minimization of the resulting test length and hardware overhead. Experimental results on ISCAS '85 and ISCAS '89 benchmark circuits demonstrate the advantages of this new LFSR reseeding approach in terms of area overhead and test application time.