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Jizuo Zhang

dblp:237/5395 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 2019
—ORCID · unresolved

Domains — the database's venue-derived domains; a paper can count in several

Applied, interdisciplinary, general and emerging computing · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Hardware reliability and fault tolerance · 87% Integrated circuit design · 13%

Topics — the 3 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Hardware reliability and fault tolerance › soft errors
multiple cell upsets		 0.412019
Dependency of well-contact density on MCUs in 65-nm bulk CMOS SRAM · Sci. China Inf. Sci. 2019
Hardware reliability and fault tolerance
soft errors		 0.412019
Dependency of well-contact density on MCUs in 65-nm bulk CMOS SRAM · Sci. China Inf. Sci. 2019
Integrated circuit design › memory circuit design
SRAM design		 0.112019
Dependency of well-contact density on MCUs in 65-nm bulk CMOS SRAM · Sci. China Inf. Sci. 2019
YearPublicationVenuePosition
2019 Dependency of well-contact density on MCUs in 65-nm bulk CMOS SRAM
Yueyue Chen, Jizuo Zhang
 Sci. China Inf. Sci.4