Robert Hackman

dblp:237/8570 · DBLP profile ↗
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4ranked-venue papers
1as first author
2since 2021 · last 2023
—ORCID · none

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Software engineering, systems software and programming languages · 4 · 1 first-author · 2 since 2021
YearPublicationVenuePosition
2023 Applying declarative analysis to industrial automotive software product line models
Ramy Shahin, Rafael F. Toledo, Robert Hackman, S. Ramesh 0002, Joanne M. Atlee, Marsha Chechik
Empir. Softw. Eng.3
2021 Applying Declarative Analysis to Software Product Line Models: An Industrial Study
abstract
Software Product Lines (SPLs) are families of related software products developed from a common set of artifacts. Most existing analysis tools can be applied to a single product at a time, but not to an entire SPL. Some tools have been redesigned/re-implemented to support the kind of variability exhibited in SPLs, but this usually takes a lot of effort, and is error-prone. Declarative analyses written in languages like Datalog have been collectively lifted to SPLs in prior work [1], which makes the process of applying an existing declarative analysis to a product line more straightforward. In this paper, we take an existing declarative analysis (behaviour alteration) and apply it to a set of automotive software product lines from General Motors. We discuss the design of the analysis pipeline used in this process, present its scalability results, and provide a means to visualize the analysis results for a subset of products filtered by feature expression. We also reflect on some of the lessons learned throughout this project.
Ramy Shahin, Robert Hackman, Rafael F. Toledo, S. Ramesh 0002, Joanne M. Atlee, Marsha Chechik
MoDELS2
2020 mel- model extractor language for extracting facts from models
abstract
There is a large body of research on extracting models from code-related artifacts to enable model-based analyses of large software systems. However, engineers do not always have access to the entire code base of a system: some components may be procured from third-party suppliers based on a Model specification or their code may be generated automatically from Models.
Robert Hackman, Joanne M. Atlee, Finn Hackett, Michael W. Godfrey
MoDELS1
2019 Detecting Feature-Interaction Symptoms in Automotive Software using Lightweight Analysis
abstract
Modern automotive software systems are large, complex, and feature rich; they can contain over 100 million lines of code, comprising hundreds of features distributed across multiple electronic control units (ECUs), all operating in parallel and communicating over a CAN bus. Because they are safety-critical systems, the problem of possible Feature Interactions (FIs) must be addressed seriously; however, traditional detection approaches using dynamic analyses are unlikely to scale to the size of these systems. We are investigating an approach that detects static source-code patterns that are symptomatic of FIs. The tools report Feature-Interaction warnings, which can be investigated further by engineers to determine if they represent true FIs and if those FIs are problematic. In this paper, we present our preliminary toolchain for FI detection. First, we extract a collection of static “facts” from the source code, such as function calls, variable assignments, and messages between features. Next, we perform relational algebra transformations on this factbase to infer additional “facts” that represent more complicated design information about the code, such as potential information flows and data dependencies; then, the full collection of “facts” is matched against a curated set of patterns for FI symptoms. We present a set of five patterns for FIs in automotive software as well a case study in which we applied our tools to the Autonomoose autonomous-driving software, developed at the University of Waterloo. Our approach identified 1,444 possible FIs in this codebase, of which 10% were classified as being probable interactions worthy of further investigation.
Bryan J. Muscedere, Robert Hackman, Davood Anbarnam, Joanne M. Atlee, Ian J. Davis, Michael W. Godfrey
SANER2