Taehee Lee 0003

dblp:24/1287-3 · DBLP profile ↗
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3ranked-venue papers
3as first author
0since 2021 · last 2018
—ORCID · conflict

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 3 · 3 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
2 papers
Electronic design automation · 95% Energy-efficient computing · 5%

Topics — the 8 heaviest of 8, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation › physical design › clock network synthesis
clock network optimization
0.312018
Clock Network Optimization With Multibit Flip-Flop Generation Considering Multicorner Multimode Timing Constraint · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2018
Electronic design automation › physical design › clock network synthesis
clock tree synthesis
0.312018
Clock Network Optimization With Multibit Flip-Flop Generation Considering Multicorner Multimode Timing Constraint · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2018
Electronic design automation
physical design
0.312018
Clock Network Optimization With Multibit Flip-Flop Generation Considering Multicorner Multimode Timing Constraint · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2018
Electronic design automation
hardware verification and test
0.312017
Enhancing Test Compression With Dependency Analysis for Multiple Expansion Ratios · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2017
Electronic design automation › hardware verification and test › design for testability
scan chain partitioning
0.312017
Enhancing Test Compression With Dependency Analysis for Multiple Expansion Ratios · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2017
Electronic design automation › hardware verification and test
test data compression
0.312017
Enhancing Test Compression With Dependency Analysis for Multiple Expansion Ratios · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2017
Energy-efficient computing › dynamic power reduction
clock power reduction
0.112018
Clock Network Optimization With Multibit Flip-Flop Generation Considering Multicorner Multimode Timing Constraint · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2018
Electronic design automation › hardware verification and test
test application time reduction
0.112017
Enhancing Test Compression With Dependency Analysis for Multiple Expansion Ratios · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2017

Methods — techniques the papers use, named apart from their topics

multicorner multimode timing analysis · 0.3flip-flop clumping · 0.3dependency analysis · 0.3cost function · 0.3
YearPublicationVenuePosition
2018 Clock Network Optimization With Multibit Flip-Flop Generation Considering Multicorner Multimode Timing Constraint
abstract
Clock network should be optimized to reduce clock power dissipation. The power efficient clock network can be constructed by multibit flip-flop generation and gated clock tree aware flip-flop clumping to pull flip-flops close to the same integrated clock gating cell. It is capable of providing an attractive solution to reduce clock power. This paper considers multicorner and multimode timing constraints for the two combined approach. This proposed method is applied to five industrial digital intellectual property blocks of state-of-the-art mobile system-on-a-chip fabricated in 14-nm CMOS process. Experimental results show that MBFF generation algorithm achieves 22% clock power reduction. Applying a gated clock tree aware flip-flop clumping on top of the MBFF generation further reduces the power to around 32%.
Taehee Lee 0003, David Z. Pan, Joon-Sung Yang
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.1
2017 Enhancing Test Compression With Dependency Analysis for Multiple Expansion Ratios
abstract
Scan test data compression is widely used in industry to reduce test data volume (TDV) and test application time (TAT). This paper shows how multiple scan chain expansion ratios can help to obtain high test data compression in system-on-chips. Scan chains are partitioned with a higher expansion ratio than normal in scan compression mode and then are gradually concatenated based on a cost function to detect any faults that could not be detected at the higher expansion ratios. It improves the overall test compression ratio since it potentially allows faults to be detected at the highest expansion ratio. This paper introduces a new cost function to choose scan chain concatenation candidates for concatenation for multiple expansion ratios. To avoid TDV and TAT increase by scan concatenation, the proposed method takes a logic structure and scan chain length into consideration. Experiment results show the proposed method reduces TAT and TDV by 53%-64% compared with a traditional scan compression method.
Taehee Lee 0003, Nur A. Touba, Joon-Sung Yang
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.1
2016 Multi-bit flip-flop generation considering multi-corner multi-mode timing constraint
abstract
Clock power is a significant portion of chip power in System-on-chip (SoC). Applying Multi-bit flip-flop (MBFF) is capable of providing attractive solution to reduce clock power. To our best knowledge, this is the first work in the literature that considers multi-corner and multi-mode (MCMM) timing constraint for the MBFF generation. This proposed method is applied to five industrial digital intellectual property (IP) blocks of state-of-the-art System-on-chip (SoC). Experimental results show that our proposed MBFF generation algorithm achieves 22% clock power reduction.
Taehee Lee 0003, JongWon Yi, Joon-Sung Yang
ISCAS1