Tongzhi Niu

dblp:249/3115 · DBLP profile ↗
← Back
8ranked-venue papers
1as first author
8since 2021 · last 2026
0000-0003-3921-5853ORCID · verified

Domains — the database's venue-derived domains; a paper can count in several

Databases, data management, data science and information retrieval · 3 · 3 since 2021Artificial intelligence and machine learning · 2 · 2 since 2021Applied, interdisciplinary, general and emerging computing · 2 · 2 since 2021Systems, architecture and hardware · 1 · 1 first-author · 1 since 2021
YearPublicationVenuePosition
2026 FPF: A Focused Perception Framework for Small Defect Identification in Complex Power Scenarios
Hui Zhang 0023, Baheti Biekezat, Yunkang Cao, Kaining Zhang, Tongzhi Niu, Yaonan Wang 0001
IEEE Trans. Ind. Informatics7
2026 SAF: A Structure-Aware Framework for Radial Ice Thickness Detection on Overhead Transmission Lines
abstract
Ice thickness estimation on overhead transmission lines (OHTL) is essential for mitigating icing-induced mechanical failures and ensuring safe grid operation. To address the challenges of detecting radial ice thickness in complex power line corridors, particularly geometric fragmentation of slender conductors and semantic ambiguity near occluded boundaries, this work proposes a structure-aware framework (SAF) based on 3-D point cloud segmentation and geometry-guided modeling. SAF introduces a structure-aware segmentation network, which integrates a cross-level spatial encoding module to preserve geometric continuity and a partition-aware loss to improve boundary localization under vegetation or tower occlusion. Building on accurate segmentation, a geometry-guided module performs centerline fitting and cross-sectional reconstruction to infer slice-level ice thickness. To support evaluation, a large-scale uncrewed aerial vehicle (UAV)-based point cloud dataset covering 32 OHTL is constructed, including six lines with ground-truth ice labels. Experimental results demonstrate that SAF achieves robust and accurate ice estimation across varied voltage levels and terrains, supporting its practical application in intelligent transmission line inspection and icing risk prevention.
Hui Zhang 0023, Youyuan Tang, Yihong Cao, Kaining Zhang, Yunkang Cao, Tongzhi Niu, Jianxu Mao, Yaonan Wang 0001
IEEE Trans. Ind. Informatics7
2024 A multisensory Interaction Framework for Human-Cyber-Physical System based on Graph Convolutional Networks
Wenqian Qi, Chun-Hsien Chen, Tongzhi Niu, Shuhui Lyu, Shouqian Sun
Adv. Eng. Informatics3
2024 NAS-ASDet: An adaptive design method for surface defect detection network using neural architecture search
Zhenrong Wang, Bin Li 0026, Shuanlong Niu, Tongzhi Niu
Adv. Eng. Informatics6
2024 Feature matching driven background generalization neural networks for surface defect segmentation
Tongzhi Niu, Ruoqi Zhang, Bin Li 0026
Knowl. Based Syst.2
2024 A drift detection method for industrial images based on a defect segmentation model
Bin Li 0026, Zhenrong Wang, Chaochao Qiu, Shuanlong Niu, Tongzhi Niu
Knowl. Based Syst.7
2023 Background-Adaptive Surface Defect Detection Neural Networks via Positive Samples
abstract
This paper focuses on the challenge of surface defect detection in manufacturing, particularly under conditions of background variation and noise interference. To tackle this issue, a novel Background-Adaptive Surface Defect Detection Network (BANet) is proposed. The BANet enhances the defect detection capabilities by improving generalization capacity through learning comparative abilities between positive samples and testing samples. In order to mitigate the impact of three types of noise (texture variation, translation, and rotation), a Foreground Edge Attention Mechanism (FEAM) and a Spatial Transformer Module (STM) are introduced. The FEAM enhances the model's ability to differentiate between foreground and background, thereby effectively reducing texture variation noise. The STM uses affine transformations to eliminate translation and rotation noise. The effectiveness of the proposed network is validated on Optical Communication Devices (OCDs) dataset, with results indicating superior performance compared to prevailing state-of-the-art methods. The findings of this study highlight the potential of our approach in effectively addressing surface defect detection in variable backgrounds and noisy conditions, thereby contributing significantly to the quality and reliability of manufacturing processes.
Tongzhi Niu, Zhenrong Wang, Ruoqi Zhang, Bin Li 0026
IECON1
2023 Selecting informative data for defect segmentation from imbalanced datasets via active learning
Bin Li 0026, Shuanlong Niu, Zhenrong Wang, Baohui Liu, Tongzhi Niu
Adv. Eng. Informatics6