Demo Data from VLDB 2026 / reviewers in the wild / expert
Younggun Jang
dblp:256/6190
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 2019
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Software engineering, systems software and programming languages · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Software engineering, system software, and programming languages
1 paper |
Software testing · 100% | |
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Embedded and real-time systems · 100% |
Topics — the 2 heaviest of 2, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Software testing
integration testing |
0.4 | 1 | 2019 | Test Automation and Its Limitations: A Case Study · ASE 2019 |
Embedded and real-time systems
embedded software |
0.1 | 1 | 2019 | Test Automation and Its Limitations: A Case Study · ASE 2019 |
Methods — techniques the papers use, named apart from their topics
case study · 0.8
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2019 | Test Automation and Its Limitations: A Case StudyabstractModern embedded systems are increasingly complex and contain multiple software layers from BSP (Board Support Packages) to OS to middleware to AI (Artificial Intelligence) algorithms like perception and voice recognition. Integrations of inter-layer and intra-layer in embedded systems provide dedicated services such as taking a picture or movie-streaming. Accordingly, it gets more complicated to find out the root cause of a system failure. This industrial proposal describes a difficulty of testing embedded systems, and presents a case study in terms of integration testing. Ahyoung Sung, Sangjun Kim, Yangsu Kim, Younggun Jang, Jongin Kim |
ASE | 4 |