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Syed Zahoor Hassan

dblp:26/4492 · DBLP profile ↗
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4ranked-venue papers
4as first author
0since 2021 · last 1986
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 4 · 4 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 90% Integrated circuit design · 10%

Topics — the 5 heaviest of 5, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
hardware verification and test
0.011984
Signature Testing of Sequential Machines · IEEE Trans. Computers 1984
Electronic design automation › hardware verification and test
sequential circuit testing
0.011984
Signature Testing of Sequential Machines · IEEE Trans. Computers 1984
Integrated circuit design
digital circuit design
0.011984
Signature Testing of Sequential Machines · IEEE Trans. Computers 1984
Electronic design automation › logic synthesis
programmable logic array
0.011984
Signature Testing of Sequential Machines · IEEE Trans. Computers 1984
Electronic design automation › hardware verification and test › test response compaction
signature analysis
0.011984
Signature Testing of Sequential Machines · IEEE Trans. Computers 1984
YearPublicationVenuePosition
1986 An Efficient Self-Test Structure for Sequential Machines
Syed Zahoor Hassan
ITC1
1984 Pseudo-Exhaustive Testing of Sequential Machines Using Signature Analysis
Syed Zahoor Hassan, Edward J. McCluskey
ITC1
1984 Signature Testing of Sequential Machines
abstract
A new approach to the testing of sequential machines is presented which employs signature analysis. In the conventional scheme of testing sequential finite state machines, distinguishing and transfer sequences are used. For the purposes of testing sequential machines by signature analysis, a signature distinguishing sequence is defined. An algorithm for augmenting a sequential machine by introducing an extra input is presented. This yields a sequential machine that has a signature distinguishing sequence. The additional cost in terms of the chip area for a programmable logic array (PLA) implementation is calculated.
Syed Zahoor Hassan
IEEE Trans. Computers1
1983 Signature Testing of Sequential Machines
Syed Zahoor Hassan
ITC1