Demo Data from VLDB 2026 / reviewers in the wild / expert
Syed Zahoor Hassan
dblp:26/4492
· DBLP profile ↗
4ranked-venue papers
4as first author
0since 2021 · last 1986
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 4 · 4 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 90% Integrated circuit design · 10% |
Topics — the 5 heaviest of 5, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation
hardware verification and test |
0.0 | 1 | 1984 | Signature Testing of Sequential Machines · IEEE Trans. Computers 1984 |
Electronic design automation › hardware verification and test
sequential circuit testing |
0.0 | 1 | 1984 | Signature Testing of Sequential Machines · IEEE Trans. Computers 1984 |
Integrated circuit design
digital circuit design |
0.0 | 1 | 1984 | Signature Testing of Sequential Machines · IEEE Trans. Computers 1984 |
Electronic design automation › logic synthesis
programmable logic array |
0.0 | 1 | 1984 | Signature Testing of Sequential Machines · IEEE Trans. Computers 1984 |
Electronic design automation › hardware verification and test › test response compaction
signature analysis |
0.0 | 1 | 1984 | Signature Testing of Sequential Machines · IEEE Trans. Computers 1984 |
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1986 | An Efficient Self-Test Structure for Sequential Machines
Syed Zahoor Hassan |
ITC | 1 |
| 1984 | Pseudo-Exhaustive Testing of Sequential Machines Using Signature Analysis
Syed Zahoor Hassan, Edward J. McCluskey |
ITC | 1 |
| 1984 | Signature Testing of Sequential MachinesabstractA new approach to the testing of sequential machines is presented which employs signature analysis. In the conventional scheme of testing sequential finite state machines, distinguishing and transfer sequences are used. For the purposes of testing sequential machines by signature analysis, a signature distinguishing sequence is defined. An algorithm for augmenting a sequential machine by introducing an extra input is presented. This yields a sequential machine that has a signature distinguishing sequence. The additional cost in terms of the chip area for a programmable logic array (PLA) implementation is calculated. Syed Zahoor Hassan |
IEEE Trans. Computers | 1 |
| 1983 | Signature Testing of Sequential Machines
Syed Zahoor Hassan |
ITC | 1 |