Demo Data from VLDB 2026 / reviewers in the wild / expert
Leo R. Piotrowski
dblp:26/5699
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 1988
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Integrated circuit design · 67% Electronic design automation · 33% |
Topics — the 3 heaviest of 3, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation
circuit simulation |
0.0 | 1 | 1988 | An improved Spice2 Zener diode model for soft-region simulation capability · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1988 |
Integrated circuit design › analog and mixed-signal circuits › device modeling
device model implementation |
0.0 | 1 | 1988 | An improved Spice2 Zener diode model for soft-region simulation capability · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1988 |
Integrated circuit design › analog and mixed-signal circuits
device modeling |
0.0 | 1 | 1988 | An improved Spice2 Zener diode model for soft-region simulation capability · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1988 |
Methods — techniques the papers use, named apart from their topics
reverse diode model · 0.0parasitic series resistance modeling · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1988 | An improved Spice2 Zener diode model for soft-region simulation capabilityabstractA Spice2-compatible reverse diode model is formulated in which improvements are made to reverse low current leakage region. In addition, the diode parasitic series resistance is included in the breakdown region of the model and forces the model parameters IBV and BV to describe the terminal characteristics, as opposed to the internal diode component as in Spice2. The proposed model has been implemented in a special version of Spice2 and the results of the simulations are presented. The results show potential for improved integrated-circuit simulation reliability due to the extended capability of the Zener reference diode model.> Leo R. Piotrowski |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 1 |