The growing prevalence and computational demands of Artificial Intelligence (AI) workloads has led to widespread use of hardware accelerators in their execution. Scaling the performance of AI accelerators across generations is pivotal to their success in commercial deployments. The intrinsic error-resilient nature of AI workloads present a unique opportunity for performance/energy improvement through precision scaling. Motivated by the recent algorithmic advances in precision scaling for inference and training, we designed RaPiD1, a 4-core AI accelerator chip supporting a spectrum of precisions, namely, 16 and 8-bit floating-point and 4 and 2-bit fixed-point. The 36mm2RaPiD chip fabricated in 7nm EUV technology delivers a peak 3.5 TFLOPS/W in HFP8 mode and 16.5 TOPS/W in INT4 mode at nominal voltage. Using a performance model calibrated to within 1% of the measurement results, we evaluated DNN inference using 4-bit fixed-point representation for a 4-core 1 RaPiD chip system and DNN training using 8-bit floating point representation for a 768 TFLOPs AI system comprising 4 32-core RaPiD chips. Our results show INT4 inference for batch size of 1 achieves 3 - 13.5 (average 7) TOPS/W and FP8 training for a mini-batch of 512 achieves a sustained 102 - 588 (average 203) TFLOPS across a wide range of applications.

Advances in deep neural networks (DNNs) and the availability of massive real-world data have enabled superhuman levels of accuracy on many AI tasks and ushered the explosive growth of AI workloads across the spectrum of computing devices. However, their superior accuracy comes at a high computational cost, which necessitates approaches beyond traditional computing paradigms to improve their operational efficiency. Leveraging the application-level insight of error resilience, we demonstrate how approximate computing (AxC) can significantly boost the efficiency of AI platforms and play a pivotal role in the broader adoption of AI-based applications and services. To this end, we present RaPiD, a multi-tera operations per second (TOPS) AI hardware accelerator core (fabricated at 14-nm technology) that we built from the ground-up using AxC techniques across the stack including algorithms, architecture, programmability, and hardware. We highlight the workload-guided systematic explorations of AxC techniques for AI, including custom number representations, quantization/pruning methodologies, mixed-precision architecture design, instruction sets, and compiler technologies with quality programmability, employed in the RaPiD accelerator.

On-chip infrastructure is an essential part of today's complex designs and enables their cost-efficient manufacturing and operation. The diversity and high number of infrastructure elements demands flexible and low-latency access mechanisms, such as reconfigurable scan networks (RSNs). The correct operation of the infrastructure access itself is highly important for the test of the system logic, its diagnosis, debug and bring-up, as well as post-silicon validation. Ensuring correct operation requires the thorough testing of the RSN.Because of sequential and combinational dependencies in RSN accesses, test generation for general RSNs is computationally very difficult and requires dedicated test strategies. This paper explores different test strategies for general RSNs and discusses the achieved structural fault coverage. Experimental results show that the combination of functional test heuristics together with a dedicated RSN test pattern generation approach significantly outperforms the test quality of a standard ATPG tool.

Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structures are particularly computationally expensive as a large number of patterns has to be evaluated.