Demo Data from VLDB 2026 / reviewers in the wild / expert
Thadeus M. Jakubow
dblp:271/1950
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 1982
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Computer networks · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer networks
1 paper |
Physical-layer communications · 100% |
Topics — the 2 heaviest of 2, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Physical-layer communications › modulation
line coding |
0.0 | 1 | 1982 | Line Code Design for High-Capacity Baseband Digital Transmission Systems · IEEE Trans. Commun. 1982 |
Physical-layer communications › interference
intersymbol interference |
0.0 | 1 | 1982 | Line Code Design for High-Capacity Baseband Digital Transmission Systems · IEEE Trans. Commun. 1982 |
Methods — techniques the papers use, named apart from their topics
symbol error probability computation · 0.0alphabetic code design · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1982 | Line Code Design for High-Capacity Baseband Digital Transmission SystemsabstractA simple model for the intersymbol interference due to a low-frequency cutoff channel is presented. The model is used to develop a computationally efficient and accurate method for computing symbol error probability for alphabetically line-encoded sequences transmitted over this channel. The model is also used to design alphabetic line codes that minimize the symbol error probability. A method is presented for comparing codes of different efficiencies (and, hence, for a given information rate, different transmission bandwidths). Sample calculations are then presented for two commercial high-capacity baseband digital transmission systems. Robert W.-S. Chang, Thadeus M. Jakubow, Alberto Leon-Garcia |
IEEE Trans. Commun. | 2 |