VLDB 2026 Research / reviewers in the wild / expert
John F. Wakerly
dblp:28/151
· DBLP profile ↗
5ranked-venue papers
4as first author
0since 2021 · last 1978
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 5 · 4 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
5 papers |
Hardware reliability and fault tolerance · 84% Integrated circuit design · 10% Distributed systems · 3% |
Topics — the 11 heaviest of 11, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Hardware reliability and fault tolerance › fault-tolerant design
fault-tolerant circuit design |
0.0 | 2 | 1975 | Comments on "Asynchronous Sequential Machines Designed for Fault Detection" · IEEE Trans. Computers 1975 Partially Self-Checking Circuits and Their Use in Performing Logical Operations · IEEE Trans. Computers 1974 |
Hardware reliability and fault tolerance
self-checking circuits |
0.0 | 2 | 1975 | Comments on "Asynchronous Sequential Machines Designed for Fault Detection" · IEEE Trans. Computers 1975 Partially Self-Checking Circuits and Their Use in Performing Logical Operations · IEEE Trans. Computers 1974 |
Hardware reliability and fault tolerance
arithmetic codes |
0.0 | 1 | 1975 | Detection of Unidirectional Multiple Errors Using Low-Cost Arithmetic Codes · IEEE Trans. Computers 1975 |
Hardware reliability and fault tolerance
error detection and correction |
0.0 | 1 | 1975 | Detection of Unidirectional Multiple Errors Using Low-Cost Arithmetic Codes · IEEE Trans. Computers 1975 |
Hardware reliability and fault tolerance › redundancy › modular redundancy
triple modular redundancy |
0.0 | 1 | 1975 | Transient Failures in Triple Modular Redundancy Systems with Sequential Modules · IEEE Trans. Computers 1975 |
Integrated circuit design
digital circuit design |
0.0 | 2 | 1975 | Comments on "Asynchronous Sequential Machines Designed for Fault Detection" · IEEE Trans. Computers 1975 Partially Self-Checking Circuits and Their Use in Performing Logical Operations · IEEE Trans. Computers 1974 |
Hardware reliability and fault tolerance › fault-tolerant architecture
fault-tolerant clock |
0.0 | 1 | 1978 | Synchronization and Matching in Redundant Systems · IEEE Trans. Computers 1978 |
Integrated circuit design › asynchronous circuit design
asynchronous sequential machine |
0.0 | 1 | 1975 | Comments on "Asynchronous Sequential Machines Designed for Fault Detection" · IEEE Trans. Computers 1975 |
Distributed systems › fault tolerance › failure recovery
state restoration |
0.0 | 1 | 1975 | Transient Failures in Triple Modular Redundancy Systems with Sequential Modules · IEEE Trans. Computers 1975 |
Hardware reliability and fault tolerance › soft errors
transient fault |
0.0 | 1 | 1975 | Transient Failures in Triple Modular Redundancy Systems with Sequential Modules · IEEE Trans. Computers 1975 |
Processor architecture and microarchitecture › arithmetic unit
arithmetic logic unit |
0.0 | 1 | 1974 | Partially Self-Checking Circuits and Their Use in Performing Logical Operations · IEEE Trans. Computers 1974 |
Methods — techniques the papers use, named apart from their topics
synchronizing sequences · 0.0sequential machine analysis · 0.0self-checking checkers · 0.0mutual feedback synchronization · 0.0fault testing · 0.0fault detection · 0.0error-detecting codes · 0.0arithmetic coding · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1978 | Synchronization and Matching in Redundant SystemsabstractMost of the published work on massive redundancy makes one crucial assumption: the redundant modules are synchronized. There are three ways of achieving synchronization in redundant systems-independent accurate clocks, a common external reference, and mutual feedback. The use of a common external reference is currently the most widely used technique, but suffers from vulnerability to common-point failures. We introduce a novel mutual feedback technique, called "synchronization voting," that does not have this drawback. A practical application of synchronization voting is described in the appendix—a fault-tolerant crystal-controlled clock. Daniel Davies, John F. Wakerly |
IEEE Trans. Computers | 2 |
| 1975 | Comments on "Asynchronous Sequential Machines Designed for Fault Detection"abstractA recent paper1has proposed the design of asynchronous sequential machines with an internal fault detection mechanism. The "hard core" circuitry in these machines can be eliminated by the use of self-checking checkers. John F. Wakerly |
IEEE Trans. Computers | 1 |
| 1975 | Transient Failures in Triple Modular Redundancy Systems with Sequential ModulesabstractThe effects of transient failures in sequential modules in systems using triple modular redundancy (TMR) cannot be neglected. A transient may place a sequential machine in an erroneous state, and the state may remain erroneous long after the transient has disappeared. We show that the state of a sequential machine can be restored after a transient if and only if the machine has a synchronizing sequence. If synchronizing sequences occur periodically during normal operation of the system, then multiple transients spaced out in time can be tolerated. System structures that have synchronizing sequences are discussed. John F. Wakerly |
IEEE Trans. Computers | 1 |
| 1975 | Detection of Unidirectional Multiple Errors Using Low-Cost Arithmetic CodesabstractWe show that a low-cost arithmtetic code with group length n detects all unidirectional multiple errors that affect fewer than n bits, as well as a larger class of such errors confined to a restricted set of bit positions. John F. Wakerly |
IEEE Trans. Computers | 1 |
| 1974 | Partially Self-Checking Circuits and Their Use in Performing Logical OperationsabstractA new class of circuits called "partially self-checking circuits" is described. These circuits have one mode of operation called secure mode in which every fault is tested in normal operation and no fault can cause an undetected error. They also have an insecure mode of operation in which undetected errors can occur; however, every fault that can cause an error in insecure mode is tested by some input in secure mode. One application of these circuits is in the arithmetic and logic unit (ALU) of a computer with data encoded in an error-detecting code. While there is no code simpler than duplication which detects single errors in logical operations such as AND and OR, it is shown that there exist partially self-checking networks to perform these operations. A commercially available medium-scale integration (MSI) chip, the 74181 4-bit ALU, can be used in a partially self-checking network to perform arithmetic and logical operations. John F. Wakerly |
IEEE Trans. Computers | 1 |