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John F. Wakerly

dblp:28/151 · DBLP profile ↗
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5ranked-venue papers
4as first author
0since 2021 · last 1978
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 5 · 4 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
5 papers
Hardware reliability and fault tolerance · 84% Integrated circuit design · 10% Distributed systems · 3%

Topics — the 11 heaviest of 11, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Hardware reliability and fault tolerance › fault-tolerant design
fault-tolerant circuit design
0.021975
Comments on "Asynchronous Sequential Machines Designed for Fault Detection" · IEEE Trans. Computers 1975
Partially Self-Checking Circuits and Their Use in Performing Logical Operations · IEEE Trans. Computers 1974
Hardware reliability and fault tolerance
self-checking circuits
0.021975
Comments on "Asynchronous Sequential Machines Designed for Fault Detection" · IEEE Trans. Computers 1975
Partially Self-Checking Circuits and Their Use in Performing Logical Operations · IEEE Trans. Computers 1974
Hardware reliability and fault tolerance
arithmetic codes
0.011975
Detection of Unidirectional Multiple Errors Using Low-Cost Arithmetic Codes · IEEE Trans. Computers 1975
Hardware reliability and fault tolerance
error detection and correction
0.011975
Detection of Unidirectional Multiple Errors Using Low-Cost Arithmetic Codes · IEEE Trans. Computers 1975
Hardware reliability and fault tolerance › redundancy › modular redundancy
triple modular redundancy
0.011975
Transient Failures in Triple Modular Redundancy Systems with Sequential Modules · IEEE Trans. Computers 1975
Integrated circuit design
digital circuit design
0.021975
Comments on "Asynchronous Sequential Machines Designed for Fault Detection" · IEEE Trans. Computers 1975
Partially Self-Checking Circuits and Their Use in Performing Logical Operations · IEEE Trans. Computers 1974
Hardware reliability and fault tolerance › fault-tolerant architecture
fault-tolerant clock
0.011978
Synchronization and Matching in Redundant Systems · IEEE Trans. Computers 1978
Integrated circuit design › asynchronous circuit design
asynchronous sequential machine
0.011975
Comments on "Asynchronous Sequential Machines Designed for Fault Detection" · IEEE Trans. Computers 1975
Distributed systems › fault tolerance › failure recovery
state restoration
0.011975
Transient Failures in Triple Modular Redundancy Systems with Sequential Modules · IEEE Trans. Computers 1975
Hardware reliability and fault tolerance › soft errors
transient fault
0.011975
Transient Failures in Triple Modular Redundancy Systems with Sequential Modules · IEEE Trans. Computers 1975
Processor architecture and microarchitecture › arithmetic unit
arithmetic logic unit
0.011974
Partially Self-Checking Circuits and Their Use in Performing Logical Operations · IEEE Trans. Computers 1974

Methods — techniques the papers use, named apart from their topics

synchronizing sequences · 0.0sequential machine analysis · 0.0self-checking checkers · 0.0mutual feedback synchronization · 0.0fault testing · 0.0fault detection · 0.0error-detecting codes · 0.0arithmetic coding · 0.0
YearPublicationVenuePosition
1978 Synchronization and Matching in Redundant Systems
abstract
Most of the published work on massive redundancy makes one crucial assumption: the redundant modules are synchronized. There are three ways of achieving synchronization in redundant systems-independent accurate clocks, a common external reference, and mutual feedback. The use of a common external reference is currently the most widely used technique, but suffers from vulnerability to common-point failures. We introduce a novel mutual feedback technique, called "synchronization voting," that does not have this drawback. A practical application of synchronization voting is described in the appendix—a fault-tolerant crystal-controlled clock.
Daniel Davies, John F. Wakerly
IEEE Trans. Computers2
1975 Comments on "Asynchronous Sequential Machines Designed for Fault Detection"
abstract
A recent paper1has proposed the design of asynchronous sequential machines with an internal fault detection mechanism. The "hard core" circuitry in these machines can be eliminated by the use of self-checking checkers.
John F. Wakerly
IEEE Trans. Computers1
1975 Transient Failures in Triple Modular Redundancy Systems with Sequential Modules
abstract
The effects of transient failures in sequential modules in systems using triple modular redundancy (TMR) cannot be neglected. A transient may place a sequential machine in an erroneous state, and the state may remain erroneous long after the transient has disappeared. We show that the state of a sequential machine can be restored after a transient if and only if the machine has a synchronizing sequence. If synchronizing sequences occur periodically during normal operation of the system, then multiple transients spaced out in time can be tolerated. System structures that have synchronizing sequences are discussed.
John F. Wakerly
IEEE Trans. Computers1
1975 Detection of Unidirectional Multiple Errors Using Low-Cost Arithmetic Codes
abstract
We show that a low-cost arithmtetic code with group length n detects all unidirectional multiple errors that affect fewer than n bits, as well as a larger class of such errors confined to a restricted set of bit positions.
John F. Wakerly
IEEE Trans. Computers1
1974 Partially Self-Checking Circuits and Their Use in Performing Logical Operations
abstract
A new class of circuits called "partially self-checking circuits" is described. These circuits have one mode of operation called secure mode in which every fault is tested in normal operation and no fault can cause an undetected error. They also have an insecure mode of operation in which undetected errors can occur; however, every fault that can cause an error in insecure mode is tested by some input in secure mode. One application of these circuits is in the arithmetic and logic unit (ALU) of a computer with data encoded in an error-detecting code. While there is no code simpler than duplication which detects single errors in logical operations such as AND and OR, it is shown that there exist partially self-checking networks to perform these operations. A commercially available medium-scale integration (MSI) chip, the 74181 4-bit ALU, can be used in a partially self-checking network to perform arithmetic and logical operations.
John F. Wakerly
IEEE Trans. Computers1