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Shenglei Zhao

dblp:284/9361 · DBLP profile ↗
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5ranked-venue papers
1as first author
5since 2021 · last 2025
0000-0002-1406-1088ORCID · corroborated

Domains — the database's venue-derived domains; a paper can count in several

Applied, interdisciplinary, general and emerging computing · 4 · 4 since 2021Artificial intelligence and machine learning · 1 · 1 first-author · 1 since 2021

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
4 papers
Integrated circuit design · 81% Hardware reliability and fault tolerance · 19%

Topics — the 7 heaviest of 8, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Integrated circuit design
power semiconductor devices
1.642023
High-breakdown-voltage (>3000 V) and low-power-dissipation Al0.3Ga0.7N/GaN/Al0.1Ga0.9N double-heterostructure HEMTs with Ohmic/Schottky hybrid drains and Al2O3/SiO2 passivation · Sci. China Inf. Sci. 2023
Unidirectional p-GaN gate HEMT with composite source-drain field plates · Sci. China Inf. Sci. 2022
Design and simulation of reverse-blocking Schottky-drain AlN/AlGaN HEMTs with drain field plate · Sci. China Inf. Sci. 2022
Integrated circuit design › semiconductor devices
GaN HEMT
1.432023
High-breakdown-voltage (>3000 V) and low-power-dissipation Al0.3Ga0.7N/GaN/Al0.1Ga0.9N double-heterostructure HEMTs with Ohmic/Schottky hybrid drains and Al2O3/SiO2 passivation · Sci. China Inf. Sci. 2023
Unidirectional p-GaN gate HEMT with composite source-drain field plates · Sci. China Inf. Sci. 2022
Investigation of heavy ion irradiation effects on 650-V p-GaN normally-off HEMTs · Sci. China Inf. Sci. 2022
Integrated circuit design › semiconductor devices
device design
0.712023
High-breakdown-voltage (>3000 V) and low-power-dissipation Al0.3Ga0.7N/GaN/Al0.1Ga0.9N double-heterostructure HEMTs with Ohmic/Schottky hybrid drains and Al2O3/SiO2 passivation · Sci. China Inf. Sci. 2023
Integrated circuit design
analog and mixed-signal circuits
0.612022
Design and simulation of reverse-blocking Schottky-drain AlN/AlGaN HEMTs with drain field plate · Sci. China Inf. Sci. 2022
Integrated circuit design › semiconductor devices › heterostructure devices
high electron mobility transistor
0.612022
Design and simulation of reverse-blocking Schottky-drain AlN/AlGaN HEMTs with drain field plate · Sci. China Inf. Sci. 2022
Hardware reliability and fault tolerance
radiation effects
0.612022
Investigation of heavy ion irradiation effects on 650-V p-GaN normally-off HEMTs · Sci. China Inf. Sci. 2022
Hardware reliability and fault tolerance › radiation effects
single event effects
0.612022
Investigation of heavy ion irradiation effects on 650-V p-GaN normally-off HEMTs · Sci. China Inf. Sci. 2022

Methods — techniques the papers use, named apart from their topics

reverse-blocking design · 0.6p-gan gate · 0.6heavy ion irradiation testing · 0.6field plate · 0.6drain field plate · 0.6
YearPublicationVenuePosition
2025 Rock burst early warning utilizing acoustic emission and electromagnetic radiation adaptive noise reduction and multi-image feature fusion: a case study
Shenglei Zhao, Enyuan Wang, Zhonghui Li, Jiankun Xu
Eng. Appl. Artif. Intell.1
2023 High-breakdown-voltage (>3000 V) and low-power-dissipation Al0.3Ga0.7N/GaN/Al0.1Ga0.9N double-heterostructure HEMTs with Ohmic/Schottky hybrid drains and Al2O3/SiO2 passivation
Yutong Fan, Ren Huang, Shenglei Zhao
Sci. China Inf. Sci.8
2022 Unidirectional p-GaN gate HEMT with composite source-drain field plates
Haiyong Wang, Shenglei Zhao, Yuanhao He, Jiabo Chen, Xuefeng Zheng, Chunfu Zhang, Jincheng Zhang 0001, Yue Hao 0001
Sci. China Inf. Sci.3
2022 Investigation of heavy ion irradiation effects on 650-V p-GaN normally-off HEMTs
Yinhe Wu, Jincheng Zhang 0001, Shenglei Zhao, Zhaoxi Wu, Zhongxu Wang, Bo Mei, Dujun Zhao, Yue Hao 0001
Sci. China Inf. Sci.3
2022 Design and simulation of reverse-blocking Schottky-drain AlN/AlGaN HEMTs with drain field plate
Dujun Zhao, Zhaoxi Wu, Bo Mei, Zhongxu Wang, Yinhe Wu, Shenglei Zhao, Jincheng Zhang 0001, Yue Hao 0001
Sci. China Inf. Sci.12