Recognition of human behavior is critical in video monitoring, human-computer interaction, video comprehension, and virtual reality. The key problem with behaviour recognition in video surveillance is the high degree of variation between and within subjects. Numerous studies have suggested background-insensitive skeleton-based as the proven detection technique. The present state-of-the-art approaches to skeleton-based action recognition rely primarily on Recurrent Neural Networks (RNN) and Convolution Neural Networks (CNN). Both methods take dynamic human skeleton as the input to the network. We chose to handle skeleton data differently, relying solely on its skeleton joint coordinates as the input. The skeleton joints’ positions are defined in (x, y) coordinates. In this paper, we investigated the incorporation of the Neural Oblivious Decision Ensemble (NODE) into our proposed action classifier network. The skeleton is extracted using a pose estimation technique based on the Residual Network (ResNet). It extracts the 2D skeleton of 18 joints for each detected body. The joint coordinates of the skeleton are stored in a table in the form of rows and columns. Each row represents the position of the joints. The structured data are fed into NODE for label prediction. With the proposed network, we obtain 97.5% accuracy on RealWorld (HAR) dataset. Experimental results show that the proposed network outperforms one the state-of-the-art approaches by 1.3%. In conclusion, NODE is a promising deep learning technique for structured data analysis as compared to its machine learning counterparts such as the GBDT packages; Catboost, and XGBoost.

Alzheimer’s disease (AD) is a progressive and irreversible neurodegenerative disease that requires attentive medical evaluation. Therefore, diagnosing of AD accurately is crucial to provide the patients with appropriate treatment to slow down the progression of AD as well to facilitate the treatment interventions. To date, deep learning by means of convolutional neural networks (CNNs) has been widely used in diagnosing of AD. There are several well-established CNNs architectures that have been used in the image classification domain for magnetic resonance imaging (MRI) images analysis such as LeNet-5, Inception-V4, VGG-16 and Residual Network. However, these existing deep learning-based methods have lack of ability to be spatial invariance to the input data, due to overlooking some salient local features of the region of interest (ROI) (i.e., hippocampal). In medical image analysis, local features of MRI images are hard to exploit due to the small pixel size of ROI. On the other hand, CNNs requires large dataset sample to perform well, but we have limited number of MRI images to train, thus, leading to overfitting. Therefore, we propose a novel deep learning-based model without pre-processing techniques by incorporating attention mechanism and global average pooling (GAP) layer to VGG-16 architecture to capture the salient features of the MRI image for subtle discriminating of AD and normal control (NC). Also, we utilize transfer learning to surpass the overfitting issue. Experiment is performed on data collected from Open Access Series of Imaging Studies (OASIS) database. The accuracy performance of binary classification (AD vs NC) using proposed method significantly outperforms the existing methods, 12-layered CNNs (trained from scratch) and Inception-V4 (transfer learning) by increasing 1.93% and 3.43% of the accuracy. In conclusion, Attention-GAP model capable of improving and achieving notable classification accuracy in diagnosing AD.

Silicon wafer defect data collected from fabrication facilities is intrinsically imbalanced because of the variable frequencies of defect types. Frequently occurring types will have more influence on the classification predictions if a model gets trained on such skewed data. A fair classifier for such imbalanced data requires a mechanism to deal with type imbalance in order to avoid biased results. This study has proposed a convolutional neural network for wafer map defect classification, employing oversampling as an imbalance addressing technique. To have an equal participation of all classes in the classifier’s training, data augmentation has been employed, generating more samples in minor classes. The proposed deep learning method has been evaluated on a real wafer map defect dataset and its classification results on the test set returned a 97.91% accuracy. The results were compared with another deep learning based auto-encoder model demonstrating the proposed method, a potential approach for silicon wafer defect classification that needs to be investigated further for its robustness.