Machine Learning (ML) has proven to be a promising solution to provide novel scalable and efficient fault management solutions in modern 5G-and-beyond communication networks. In the context of microwave networks, ML-based solutions have received significant attention. However, current solutions can only be applied to monolithic scenarios in which a single entity (e.g., an operator) manages the entire network. As current network architectures move towards disaggregated communication platforms in which multiple operators and vendors collaborate to achieve cost-efficient and reliable network management, new ML-based approaches for fault management must tackle the challenges of sharing business-critical information due to potential conflicts of interest. In this study, we explore the application of Federated Learning in disaggregated microwave networks for failure-cause identification using a real microwave hardware failure dataset. In particular, we investigate the application of two Vertical Federated Learning (VFL), namely using Split Neural Networks (SplitNNs) and Federated Learning based on Gradient Boosting Decision Trees (FedTree), on different multi-vendor deployment scenarios, and we compare them to a centralized scenario where data is managed by a single entity. Our experimental results show that VFL-based scenarios can achieve F1-Scores consistently within at most a 1% gap with respect to a centralized scenario, regardless of the deployment strategies or model types, while also ensuring minimal leakage of sensitive-data.

We investigate classifying hardware failures in microwave networks via Machine Learning (ML). Although MLbased approaches excel in this task, they usually provide only hard failure predictions without guarantees on their reliability, i.e., on the probability of correct classification. Generally, accumulating data for longer time horizons increases the model’s predictive accuracy. Therefore, in real-world applications, a trade-off arises between two contrasting objectives: i) ensuring high reliability for each classified observation, and ii) collecting the minimal amount of data to provide a reliable prediction. To address this problem, we formulate hardware failure-cause identification as an As-Soon-As-Possible (ASAP) selective classification problem where data streams are sequentially provided to an ML classifier, which outputs a prediction as soon as the probability of correct classification exceeds a user-specified threshold. To this end, we leverage Inductive and Cross Venn-Abers Predictors to transform heuristic probability estimates from any ML model into rigorous predictive probabilities. Numerical results on a real-world dataset show that our ASAP framework reduces the time-to-predict by 8x compared to the state-of-the-art, while ensuring a selective classification accuracy greater than 95%. The dataset utilized in this study is publicly available, aiming to facilitate future investigations in failure management for microwave networks.

We consider the problem of classifying hardware failures in microwave networks given a collection of alarms using Machine Learning (ML). While ML models have been shown to work extremely well on similar tasks, an ML model is, at most, as good as its training data. In microwave networks, building a good-quality dataset is significantly harder than training a good classifier: annotating data is a costly and time-consuming procedure. We, therefore, shift the perspective from a Model-Centric approach, i.e., how to train the best ML model from a given dataset, to a Data-Centric approach, i.e., how to make the best use of the data at our disposal. To this end, we explore two orthogonal Data-Centric approaches for hardware failure identification in microwave networks. At training time, we leverage synthetic data generation with Conditional Variational Autoencoders to cope with extreme data imbalance and ensure fair performance in all failure classes. At inference time, we leverage Batch Uncertainty-based Active Learning to guide the data annotation procedure of multiple concurrent domain-expert labelers and achieve the best possible classification performance with the smallest possible training dataset. Illustrative experimental results on a real-world dataset show that our Data-Centric approaches allow for training top-performing models with ~4.5x less annotated data, while improving the classifier’s F1-Score by ~2.5% in a condition of extreme data scarcity. Finally, for the first time to the best of our knowledge, we make our dataset (curated by microwave industry experts) publicly available, aiming to foster research in data-driven failure management.

Artificial Intelligence (AI) has demonstrated superhuman capabilities in solving a significant number of tasks, leading to widespread industrial adoption. For in-field network-management application, AI-based solutions, however, have often risen skepticism among practitioners as their internal reasoning is not exposed and their decisions cannot be easily explained, preventing humans from trusting and even understanding them. To address this shortcoming, a new area in AI, called Explainable AI (XAI), is attracting the attention of both academic and industrial researchers. XAI is concerned with explaining and interpreting the internal reasoning and the outcome of AI-based models to achieve more trustable and practical deployment. In this work, we investigate the application of XAI for network management, focusing on the problem of automated failure-cause identification in microwave networks. We first introduce the concept of XAI, highlighting its advantages in the context of network management, and we discuss in detail the concept behind Shapley Additive Explanations (SHAP), the XAI framework considered in our analysis. Then, we propose a framework for a XAI-assisted ML-based automated failure-cause identification in microwave networks, spanning model’s development and deployment phases. For the development phase, we show how to exploit SHAP for feature selection and how to leverage SHAP to inspect misclassified instances during model’s development process, and how to describe model’s global behavior based on SHAP’s global explanations. For the deployment phase, we propose a framework based on predictions uncertainty to detect possibly wrong predictions that will be inspected through XAI.

Automated failure-cause identification in communication networks allows operators to reduce service unavailability. Once the most likely failure root-cause is identified, appropriate countermeasures can be effectively put in place (e.g., by choosing an in-field intervention vs. a remote equipment reconfiguration). In this article, we describe a successful application of Machine Learning (ML) for automatic failure identification in microwave networks based on the real-field data. On microwave links, different heterogeneous causes (e.g., adverse atmospheric conditions, or obstacles) lead to service unavailability and produce not easily-distinguishable degradation effects on the transmission parameters. Hence, failure identification is traditionally accomplished by domain experts via direct inspection of transmission-parameter logs. As a first contribution, we identify six categories of failure causes in microwave networks and show that supervised ML enables very accurate failure identification, hence significantly simplifying failure troubleshooting. Comparing various ML algorithms, we find that up to 93% classification accuracy is obtained using real-field labeled datasets with 2513 points. One main hindrance to the application of supervised learning is that, in real network deployments, limited amount of labeled data is available for training, as manual labeling is performed by domain experts based on their knowledge and experience. On the other hand, collecting unlabeled data is relatively simple as network management systems retrieve large amounts of unlabeled information automatically. As a second contribution, we investigate an automated labeling procedure, based on autoencoders-like Artificial Neural Networks, to combine the knowledge of the few manually-labeled data with large unlabeled data. Results show that our data augmentation based on autoencoders can slightly improve failure-cause identification only when Artificial Neural Networks or Support Vector Machines are used, while accuracy slightly decreases when adopting Random Forest.