Demo Data from VLDB 2026 / reviewers in the wild / expert
Xuezhong Lin
dblp:297/3739
· DBLP profile ↗
2ranked-venue papers
1as first author
2since 2021 · last 2024
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 2 · 1 first-author · 2 since 2021
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 100% |
Topics — the 2 heaviest of 2, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation
design for manufacturability |
0.8 | 1 | 2024 | Lithography Hotspot Detection Based on Heterogeneous Federated Learning With Local Adaptation and Feature Selection · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2024 |
Electronic design automation › physical design › lithography
lithography hotspot detection |
0.8 | 1 | 2024 | Lithography Hotspot Detection Based on Heterogeneous Federated Learning With Local Adaptation and Feature Selection · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2024 |
Methods — techniques the papers use, named apart from their topics
local adaptation · 0.8federated learning · 0.8feature selection · 0.8
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2024 | Lithography Hotspot Detection Based on Heterogeneous Federated Learning With Local Adaptation and Feature SelectionabstractSince the scaling of advanced technology nodes is pushing to its physical limit, lithography hotspot detection (LHD) has become more significant than ever in design for manufacturability. Recently, machine learning techniques have been deployed to greatly reduce simulation time for hotspot detection, but high-quality data are required to build a model. Many design companies do not have enough high-quality data and are hesitant to share it for fear of intellectual property theft or model ineffectiveness. Furthermore, using locally trained models with limited and similar data can lead to overfitting and a lack of generalization and robustness when applied to new designs. In this article, we propose a heterogeneous federated learning framework for LHD that can address the aforementioned issues. Our framework can overcome the challenges of nonindependent and identically distributed data and heterogeneous communication, ensuring high performance and good convergence in various scenarios. The proposed framework creates a more robust centralized global submodel through heterogeneous knowledge sharing while keeping local data private. Then, it combines the global submodel with a local submodel for better adaptation to local data heterogeneity. Our experimental results show that the proposed framework outperforms other state-of-the-art methods. Jingyu Pan, Xuezhong Lin, Jinming Xu 0002, Yiran Chen 0001, Cheng Zhuo |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 2 |
| 2022 | Lithography Hotspot Detection via Heterogeneous Federated Learning with Local AdaptationabstractAs technology scaling is approaching its physical limit, lithography hotspot detection has become an essential task in design for manufacturability. Although the deployment of machine learning in hotspot detection is found to save significant simulation time, such methods typically demand non-trivial quality data to build the model. While most design houses are actually short of quality data, they are also unwilling to directly share such layout related data to build a unified model due to the concerns on IP protection and model effectiveness. On the other hand, with data homogeneity and insufficiency within each design house, the locally trained models can be easily over-fitted, losing generalization ability and robustness when applying to the new designs. In this paper, we propose a heterogeneous federated learning framework for lithography hotspot detection that can address the aforementioned issues. The framework can build a more robust centralized global sub-model through heterogeneous knowledge sharing while keeping local data private. Then the global sub-model can be combined with a local submodel to better adapt to local data heterogeneity. The experimental results show that the proposed framework can overcome the challenge of non-independent and identically distributed (non-IID) data and heterogeneous communication to achieve very high performance in comparison to other state-of-the-art methods while guaranteeing good convergence in various scenarios. Xuezhong Lin, Jingyu Pan, Jinming Xu 0002, Yiran Chen 0001, Cheng Zhuo |
ASP-DAC | 1 |